Samsung Electronics Co., Ltd.

Deok Ho Seo

Min Su Kim

Won Jae Shin

Nam Hyung Kim

Chang Min Lee

Yong Jun Yu

Il Gyu Jung

In Su Choi

Do-Han Kim

Dae-Jeong Kim

Dae Jeong Kim

Do Han Kim

An electronic device including a memory device with improved reliability is provided. The semiconductor device comprises a data pin configured to transmit a data signal, a command/address pin configured to transmit a command and an address, a command/address receiver connected to the command/address pin, and a computing unit connected to the command/address receiver, wherein the command/address receiver receives a first command and a first address from the outside through the command/address pin and generates a first instruction on the basis of the first command and the first address, and the computing unit receives the first instruction and performs computation based on the first instruction.

Semiconductor device and electronic device including the same

A semiconductor device including a memory device which has improved reliability is provided. The semiconductor device comprises at least one data pin configured to transfer a data signal, at least one command address pin configured to transfer a command and an address, at least one serial pin configured to transfer a serial data signal, and processing circuitry connected to the at least one data pin and the at least one serial pin. The processing circuitry is configured to receive the data signal from outside through the at least one data pin, and the processing circuitry is configured to output the serial data signal through the at least one serial pin in response to the received data signal.

Semiconductor device and electronic device with serial, data transfer mechanism

A memory module includes a memory device configured to receive a first refresh command from a host, and perform a refresh operation in response to the first refresh command during a refresh time, and a computing unit configured to detect the first refresh command provided from the host to the memory device, and write a first error pattern at a first address of the memory device during the refresh time.

Memory module and operating method

Growing community of inventors

Suwon-si, South Korea

Deok Ho Seo