Seagate Technology Incorporated

Dennis Quinto Cruz

Grant Nicholas Hester

Timothy Ronald Brown

David Maxwell Harrold

Jonathan Pahl Jones

Jason P Delaney

Hans John Geittmann

Tommy Joe Metzner

Sumit Chandra

Carl John Naley

Darrell R Johnson

Mark L Simpson

Richard Nguyen

Nathaniel Patrick Sheppleman

Aspects of the disclosure are directed to apparatuses and methods involving particulate sampling. As may be consistent with one or more embodiments, an apparatus includes a flow direction structure, a flow sampler and a particle collector having a collecting surface. The flow direction structure has interior sidewalls that direct the flow of particulate-laden gas along a flow path. The flow sampler is located in the flow path within the interior sidewalls, and operates with the flow direction structure to sample a portion of the particulate-laden gas at a reduced velocity, while allowing another portion of the particulate-laden gas to exhaust around the flow sampler. The flow sampler operates with the particle collector to direct the sampled portion of the particulate-laden gas to the collecting surface, and to adhere particulates from the particulate-laden gas to the collecting surface.

Particle collector

Certain exemplary aspects of the present disclosure are directed towards apparatuses and methods which autonomously decontaminate parts. Parts to be cleaned are identified, and based on the identification of the part, a part specific cleaning program is initiated. During the cleaning, the part is manipulated about a gas supply in such a way that the drag force on the contamination particles attached to the part exceeds the contamination particles' surface adhesion force and accordingly is removed from the surface of the part. The removed contamination is then evacuated from the atmospheric environment near the part by a low pressure zone of a second gaseous material near the part.

Workpiece cleaning

A test baseplate is configured to support and expose at least one storage device component to particle evacuation and particle analysis. The test baseplate includes a base having an upper surface that extends between an outer peripheral wall and an inner peripheral wall and having a lower surface defined by the inner peripheral wall. The test baseplate also includes a top clamp configured to be fastened to the upper surface of the base to secure the at least one storage device component to the base.

Baseplate for use in particle analysis

An apparatus and associated method are provided for treating a workpiece with a cryogenic impingement fluid. A fixture supports the workpiece in an upright position and operably connects an electrical component of the workpiece to a power source in the supported position. A cryogenic impingement fluid applicator sprays a stream of the cryogenic impingement fluid against the supported workpiece and laterally moves the stream in accordance with a predetermined path. A shield deflects the stream of cryogenic impingement fluid to prevent the stream from contacting at least a part of the workpiece as the stream is moved along the predetermined path.

A process for assembling data storage components in which a cylindrically shaped first structure of a data storage device is inserted into an aperture of a second structure, the first structure having a circumferentially extending outer surface and the aperture of the second structure having an aperture sidewall. An annular gap is formed between the outer surface of the first structure and the inner sidewall of the aperture of the second structure, and a plurality of discrete dots of adhesive are placed to span the annular gap following which the adhesive is cured by exposing the adhesive to ultraviolet radiation to attaches the first and second structures into a sub-assembly.

Assembly of data storage components

An apparatus for use in attaching a head gimbal assembly (HGA) onto an actuator arm of an actuator assembly during an HGA installation process. The apparatus includes, a central body portion with a base support surface; and a pair of support arms extending from the central body portion forming a channel sized to accommodate expansion of an attachment aperture of an actuator arm during the installation process. Each support arm includes, a first and second support surface offset from and parallel to the base support surface. A first support arm thickness is formed between the first support surface and the base support surface, while a second support arm thickness is formed between the second support surface and the base support having a thickness less than the first support arm thickness. Each support arm thickness supports a corresponding HGA adjacent actuator arm during the installation process.

Growing community of inventors

Longmont, CO, United States of America

Dennis Quinto Cruz