Growing community of inventors

Marion, NY, United States of America

Dennis Lee Venable

Average Co-Inventor Count = 2.15

ph-index = 21

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 1,434

Dennis Lee VenableWencheng Wu (18 patents)Dennis Lee VenableThomas F Wade (18 patents)Dennis Lee VenableCharles Donahue Rizzolo (11 patents)Dennis Lee VenableDaniel S Hann (9 patents)Dennis Lee VenablePeter Paul (8 patents)Dennis Lee VenableJames E Bollman (8 patents)Dennis Lee VenableMichael Robert Campanelli (7 patents)Dennis Lee VenableSteven Robert Moore (6 patents)Dennis Lee VenableAdrien Pierre Cote (6 patents)Dennis Lee VenableWilliam A Fuss (5 patents)Dennis Lee VenableEthan Shen (5 patents)Dennis Lee VenableRiyad Twahir (5 patents)Dennis Lee VenableYi-Ting Shen (5 patents)Dennis Lee VenableJohn C Handley (4 patents)Dennis Lee VenableReiner Eschbach (3 patents)Dennis Lee VenableTakashi Nagao (3 patents)Dennis Lee VenableAdrien Pierre Côté (3 patents)Dennis Lee VenableM Armon Rahgozar (3 patents)Dennis Lee VenablePamela B Spiteri (3 patents)Dennis Lee VenableLee Anne Williams (3 patents)Dennis Lee VenableAnoop M Namboodiri (3 patents)Dennis Lee VenableRichard Zanibbi (3 patents)Dennis Lee VenableZhigang Fan (2 patents)Dennis Lee VenableEric Michael Gross (2 patents)Dennis Lee VenableThyagarajan Balasubramanian (2 patents)Dennis Lee VenableToshiya Yamada (2 patents)Dennis Lee VenableKazuya Yamada (2 patents)Dennis Lee VenablePatrick A Fleckenstein (2 patents)Dennis Lee VenableRobert P Loce (1 patent)Dennis Lee VenableRaja Bala (1 patent)Dennis Lee VenableMartin Sidney Maltz (1 patent)Dennis Lee VenableEric Scott Hamby (1 patent)Dennis Lee VenablePeter John Knausdorf (1 patent)Dennis Lee VenableRicardo L De Queiroz (1 patent)Dennis Lee VenableDavid E Rumph (1 patent)Dennis Lee VenableSaurabh Prabhat (1 patent)Dennis Lee VenableLee Coy Moore (1 patent)Dennis Lee VenableGraham Stephen Pennington (1 patent)Dennis Lee VenablePhillip J Emmett (1 patent)Dennis Lee VenableRichard Leighton Howe (1 patent)Dennis Lee VenableSafwan R Wshah (1 patent)Dennis Lee VenableTerry C Wells (1 patent)Dennis Lee VenableScott Mayne (1 patent)Dennis Lee VenableMichael C Lacagnina (1 patent)Dennis Lee VenableMegan Clar (1 patent)Dennis Lee VenableEric Harte (1 patent)Dennis Lee VenableRoger A Newell (1 patent)Dennis Lee VenableThomas C Rich (1 patent)Dennis Lee VenableLee Anne S Williams (1 patent)Dennis Lee VenableRamana L Rao (1 patent)Dennis Lee VenableEthan Shen (1 patent)Dennis Lee VenableDennis Lee Venable (62 patents)Wencheng WuWencheng Wu (145 patents)Thomas F WadeThomas F Wade (30 patents)Charles Donahue RizzoloCharles Donahue Rizzolo (36 patents)Daniel S HannDaniel S Hann (15 patents)Peter PaulPeter Paul (119 patents)James E BollmanJames E Bollman (21 patents)Michael Robert CampanelliMichael Robert Campanelli (37 patents)Steven Robert MooreSteven Robert Moore (114 patents)Adrien Pierre CoteAdrien Pierre Cote (46 patents)William A FussWilliam A Fuss (46 patents)Ethan ShenEthan Shen (12 patents)Riyad TwahirRiyad Twahir (5 patents)Yi-Ting ShenYi-Ting Shen (5 patents)John C HandleyJohn C Handley (67 patents)Reiner EschbachReiner Eschbach (202 patents)Takashi NagaoTakashi Nagao (42 patents)Adrien Pierre CôtéAdrien Pierre Côté (10 patents)M Armon RahgozarM Armon Rahgozar (10 patents)Pamela B SpiteriPamela B Spiteri (9 patents)Lee Anne WilliamsLee Anne Williams (4 patents)Anoop M NamboodiriAnoop M Namboodiri (3 patents)Richard ZanibbiRichard Zanibbi (3 patents)Zhigang FanZhigang Fan (211 patents)Eric Michael GrossEric Michael Gross (76 patents)Thyagarajan BalasubramanianThyagarajan Balasubramanian (34 patents)Toshiya YamadaToshiya Yamada (14 patents)Kazuya YamadaKazuya Yamada (4 patents)Patrick A FleckensteinPatrick A Fleckenstein (3 patents)Robert P LoceRobert P Loce (273 patents)Raja BalaRaja Bala (171 patents)Martin Sidney MaltzMartin Sidney Maltz (71 patents)Eric Scott HambyEric Scott Hamby (62 patents)Peter John KnausdorfPeter John Knausdorf (60 patents)Ricardo L De QueirozRicardo L De Queiroz (48 patents)David E RumphDavid E Rumph (33 patents)Saurabh PrabhatSaurabh Prabhat (31 patents)Lee Coy MooreLee Coy Moore (24 patents)Graham Stephen PenningtonGraham Stephen Pennington (21 patents)Phillip J EmmettPhillip J Emmett (18 patents)Richard Leighton HoweRichard Leighton Howe (17 patents)Safwan R WshahSafwan R Wshah (13 patents)Terry C WellsTerry C Wells (6 patents)Scott MayneScott Mayne (5 patents)Michael C LacagninaMichael C Lacagnina (5 patents)Megan ClarMegan Clar (3 patents)Eric HarteEric Harte (3 patents)Roger A NewellRoger A Newell (3 patents)Thomas C RichThomas C Rich (3 patents)Lee Anne S WilliamsLee Anne S Williams (1 patent)Ramana L RaoRamana L Rao (1 patent)Ethan ShenEthan Shen (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Xerox Corporation (43 from 24,195 patents)

2. Conduent Business Services, LLC (17 from 334 patents)

3. Other (2 from 832,843 patents)

4. Fuji Xerox Co., Ltd. (2 from 11,665 patents)


62 patents:

1. 11481746 - Store shelf imaging system

2. 11176399 - Method and system for acquiring images of a product from multiple angles

3. 11176401 - Method and system for acquiring multi-angle images of a product

4. 11176400 - Multi-angle product imaging device

5. 10509978 - Multi-angle product imaging device

6. 10453046 - Store shelf imaging system

7. 10325511 - Method and system to attribute metadata to preexisting documents

8. 10289990 - Store shelf imaging system and method

9. 10210603 - Store shelf imaging system and method

10. 10176452 - Store shelf imaging system and method

11. 10108872 - Multi-angle product imaging device

12. 10019803 - Store shelf imaging system and method using a vertical LIDAR

13. 10002291 - Method and system of identifying fillable fields of an electronic form

14. 10002344 - System and method for retail store promotional price tag detection

15. 9928438 - High accuracy localization system and method for retail store profiling via product image recognition and its corresponding dimension database

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