Suss Microtec Test Systems Gmbh

Semiprobe LLC

Denis Place

Don Feuerstein

Claus Dietrich

Stefan Schneidewind

Frank-Michael Werner

Mostafa Daoudi

Mike Lancaster

A modular probe system that includes components that are selected to test different devices-under-test (DUTs) in a number of different scientific fields. The system includes quick-release connectors that may be used to releasably secure components of the modular probe system to one another or to a mounting interface. These connectors permit quick and easy attachment and detachment of various components in a manner that permits a user to readily configure the probe system for each DUT.

Modular probe system

An apparatus for testing substrates reduces the area required and the costs which arise with the testing of substrates, in particular semiconductor wafers, during the production process. The apparatus includes testing arrangements comprising a chuck, a chuck drive, control electronics, probe or probe board holding means with a handling system, a substrate magazine station and an alignment station. The testing arrangements include at least two testing arrangements, both of which are all jointly operatively connected to the handling system, the substrate magazine station and the alignment station.

Apparatus for testing substrates

Growing community of inventors

Colchester, VT, United States of America

Denis Place