Essilor International

Essilor International (Compagnie Generale D'optique)

Denis Mazuet

Gilles Le Saux

Pascal Allione

Jean-Pierre Chauveau

Werner Mohr

Patrick Bertrand

Do Quyen Phan

The invention relates to a method of calculating an optical system (OS), the optical system (OS) being identified by a function (OF), the optical system (OS) comprising a first part (F) defined by a first equation (EF) and a second part (F) defined by a second equation (EF), the method comprising: &#x2014;a generating step (GEN), in which a virtual optical system (VOS) is used to generate a virtual function (VOF); &#x2014;a modification step (MOD), in which the virtual function (VOF) is modified so as obtain the function (OF); &#x2014;a calculation step (CAL), in which the second equation (EF) is calculated from the function (OF), and the first equation (EF). The invention relates also to a method of manufacturing an optical system (OS).

Method of manufacturing an optical system

A fringe deflectometry apparatus illuminates an optical component to be measured using radiation with a known wavefront, deflects the radiation after it has been reflected or transmitted by the optical component to be measured, and materializes a reference ray. Transverse aberration of the reference ray after reflection or transmission by the optical component is measured. A deflectometry method using the apparatus enables an absolute phase reference to be provided.

Fringe deflectometry apparatus and method

Growing community of inventors

Charenton le Pont, France

Denis Mazuet