Ecole Polytechnique

Centre National De La Recherche Scientifique

Delphine Debarre

Nicolas Olivier

Emmanuel Jean-Marc Beaurepaire

Jean-Louis Martin

Marie-Claire Schanne-Klein

Pierre Mahou

Emmanuel Beaurepaire

Mathias Strupler

Thibault Vieille

Jean Louis Martin

A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.

Quantitative nonlinear optical microscopy using a shaped beam

A method and system for calibrating an optical device having a spatial optical modulator () and including: an optical lens () of a large numerical aperture, capable of receiving an incident beam and/or collecting an optical beam reflected by a sample; a camera () disposed in a plane optically conjugate with the focal plane of the lens (); and a spatial optical modulator () disposed on the optical beam upstream of the camera (). The method includes the following steps consisting in: acquiring three-dimensional images of the PSF in terms of intensity in a plane conjugate with the focal plane of the lens (), reconstructing the profile in terms of amplitude and/or phase of the beam using a phase diversity algorithm, and determining the respective influence functions of a plurality of elements P, . . . , Pof the spatial optical modulator () on the profile in terms of the amplitude A and/or phase &#x3c6; of the beam.

Method and system for calibrating a spatial optical modulator in an optical microscope

A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.

Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials

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Paris, France

Delphine Debarre