Iowa State University Research Foundation Inc

Other

Texas Instruments Corporation

Degang James Chen

Randall L Geiger

Zhongjun Yu

Yuming Zhuang

Turker Kuyel

Mona Ganji

Kumar Lakshmi Parthasarathy

Le Jin

Beatriz Olleta

Zhiqiang Liu

Benjamin Magstadt

Hanjun Jiang

The present disclosure relates to a temperature-to-digital converter that fulfills the requirement of sensing temperature in applications, such as automotive, where operation in a wide temperature range is essential. Due to the dependency of the transistor models on the temperature, the conventional temperature sensors have a limited range in which they have an acceptable function. The disclosed sensor overcomes this problem by introducing a design independent of the transistor model and relies on cancelling and matching temperature non-linearity of different blocks. The approach according to the present disclosure enables the design of a temperature sensor that is operational in the never before achieved range of −55° C. to 200° C.

Wide range temperature-to-digital converter without explicit data converters

The present disclosure relates to a voltage reference generator without temperature dependency. The disclosed voltage reference generator includes a precursor voltage generator and a voltage extractor. The precursor voltage generator is configured to provide a base-emitter voltage, a proportional-to-absolute-temperature (PTAT) voltage, and a nonlinear (NL) voltage. The voltage extractor is configured to scale and sum the base-emitter voltage, the NL voltage, and the PTAT voltage and provide an output voltage, such that linear temperature dependent components and nonlinear temperature dependent components within the base-emitter voltage, the NL voltage, and the PTAT voltage are not included in the output voltage, which is temperature independent.

Voltage reference generator with linear and non-linear temperature dependency elimination

The present disclosure relates to a digital-to-analog converter (DAC) linearization system including a DAC, a summing buffer structure, an analog-to-digital converter (ADC), a calculation system, an error look-up table, and an adder. A combination of the DAC, the summing buffer structure, and the ADC sequentially provide first and second ADC output signals, both of which include DAC integral nonlinearity (INL). The calculation system calculates the DAC INL based on the first and second ADC output signals, the error look-up table provides a correction signal mapping to the calculated DAC INL, and the adder provides a calibrated digital input signal to the DAC based on the correction signal. The calibrated digital input signal ensures the DAC to generate an updated output signal with less nonlinearity and improved purity.

Cost effective DAC linearization system

The present disclosure relates to a signal generator with self-calibration including a main digital-to-analog converter (DAC), a calibration DAC, a summing buffer structure, a two-path filter structure, an analog-to-digital converter (ADC), and a control system. The main DAC provides a main DAC output signal with main DAC distortion. The main DAC output signal is calibrated by a calibration DAC output signal to correct at least a portion of the main DAC distortion. The calibration DAC output signal includes information about the main DAC distortion and is generated by a feedback loop including the summing buffer structure, the two-path filter structure, the filter buffer, the ADC, the control system, and the calibration DAC.

Signal generator with self-calibration

A method for testing an analog-to-digital converter is disclosed. In an implementation, the method may include providing input data to analog-to-digital converter circuitry. The analog-to-digital converter circuitry generates an output code based upon the input data. The method includes generating expected output code based upon the corresponding input data and generating an output code error signal based upon the difference of the output code and the expected output code. A predicted code error signal is modeled based upon corresponding code. The method also includes generating a noise error signal representing a difference between the output code error signal and the predicted code error.

System and methodology for analog-to-digital converter linearity testing

A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.

Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization

A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.

Growing community of inventors

Ames, IA, United States of America

Degang James Chen