Sigtuple Technologies Private Limited

Deepanker

Ashish Kumar Lal

Abhishek Shukla

Neha Dixit

Avilash

The present disclosure discloses a calibration slide for calibration of an automated microscope. The slide includes at least one calibration zone defined on at least one major surface of the sample slide. The at least one calibration zone is divided by a cross hair to define a plurality of quadrants. Each of the plurality of quadrants is defined with an array of apertures of varying density of arrays. The automated microscope including the calibration slide of the present disclosure enables corrective maintenance. The method of the present disclosure may be employed across various automated microscopes within a lab or at labs at various locations through offline/online mode to achieve similar results when tested on same sample.

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New Delhi, India

Deepanker