Analog Devices International Unlimited Company

Deepak Gunasekaran

Steven J Tanghe

Brian Kirk Jadus

Michael Collins

Kenneth G Richardson

Eric Benedict

Ryan Schnell

Art Zirger

Maurice Moroney

An apparatus and methods to operate the same to provide fast fault-detection on power semiconductor devices such as power transistors are disclosed. In some embodiment, a desaturation based fault-detection circuit for a power transistor is provided. The fault-detection circuit has an adaptable blanking time and a disconnect switch in the blanking mechanism that allow for quick enabling of fault-detection mechanisms to achieve fast fault detection times on power semiconductor devices.

Apparatus and method to achieve fast-fault detection on power semiconductor devices

Systems and methods for early-onset electrical fault detection are described in which a rate-of-rise of channel current in a device such as a transistor is sensed, indicating whether an electrical fault is present. In some embodiments, the rate-of-rise of the channel current may be sensed by detecting whether a current flowing away from a control terminal of the device is greater than a threshold level. In the event that an electrical fault is detected, the device may be shut off to prevent damage to the device.

Short-circuit protection of power semiconductor device by sensing current injection from drain to gate

An electronic circuit comprises a power switch circuit and a fault detection circuit. The power switch circuit includes a transistor. The fault detection circuit includes a first comparator circuit configured to compare a monitored voltage of the transistor to a detection threshold voltage and produce an indication of a circuit fault according to the comparing, and a delay circuit configured to delay the comparing by the first comparator circuit according to slew rate of the monitored voltage.

Adaptive blanking of over current fault detection circuits in power conversion gate drivers

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Longmont, CO, United States of America

Deepak Gunasekaran