Sensor Platforms, Inc.

Deborah Meduna

Dev G Rajnarayan

Ian Chen

James V Steele

Tom Waite

A processing apparatus including one or more processors and memory obtains one or more sensor measurements generated by one or more monitoring sensors of one or more devices, including one or more monitoring sensor measurements from a respective monitoring sensor of a respective device and obtains one or more system signals including a respective system signal corresponding to current operation of the respective device. The processing apparatus determines device context information for the respective device based on the one or more sensor measurements and the one or more system signals and adjusts operation of the device in accordance with the device context information.

Combining monitoring sensor measurements and system signals to determine device context

A processing apparatus including one or more processors and memory receives sensor measurements generated by one or more sensors of one or more devices, pre-classifies the sensor measurements as belonging to one of a plurality of pre-classifications, and selects one or more feature types to extract from the sensor measurements based at least in part on the pre-classification of the sensor measurements. The processing apparatus also extracts features of the one or more selected feature types from the sensor measurements and determines a state of a respective device of the one or more devices in accordance with a classification of the sensor measurements determined based on the one or more features extracted from the sensor measurements.

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San Francisco, CA, United States of America

Deborah Meduna