Future Wei Technologies, Inc.

Zenasis Technologies, Inc.

Texas Instruments Corporation

Debashis Bhattacharya

Alan Gatherer

Mark W Brown

Vamsi Boppana

Alex Elisa Chandra

Ashish Rai Shrivastava

Rabindra Roy

Anthony C K Soong

Fang Yu

Hao Luan

Rajeev Murgai

Lee Dobson McFearin

Tong Sun

Peter Yan

Xiaotao Chen

Jayanta Roy

Xingfeng Chen

Yan Bei

Ke Ning

Chushun Huang

A data warehouse engine (DWE) includes a central processing unit (CPU) core and a first data organization unit (DOU), where the first DOU is configured to aggregate read operations. The DWE also includes a first command queue coupled between the CPU core and the first DOU, where the first command queue is configured to convey commands from the CPU core to the first DOU.

System and method for data warehouse engine

A computation system-on-a-chip (CSoC) includes a first scalable distributed real-time Data Warehousing (sdrDW) engine and a network interface coupled to the first sdrDW engine, where the network interface is coupled to an interconnect, and where the CSoC is configured to transmit a task request over the interconnect to a first networked bulk storage controller (NBSC) requesting that a task be performed on a bulk storage medium.

System and method for scalable distributed real-time data warehouse

A method includes receiving, by a real-time Data Warehouse (rDW) from a first task, a first dataset and spreading the first dataset to produce a first plurality of objects, where the first plurality of objects includes a first object and a second object. The method also includes storing the first object in a first location in an rDW data repository and storing the second object in a second location in the rDW data repository.

System and method for real-time data warehouse

Methods and apparatus for inter-process communication are provided. A circuit may have a plurality of clusters, and at least one cluster may have a computation element (CE), a memory operatively coupled with the CE, and an autonomic transport system (ATS) block operatively coupled with the CE and the memory. The ATS block may be configured to perform inter-process communication (IPC) for the at least one cluster. In one embodiment, the ATS block may transfer a message to a different cluster based on a request from the CE. In another embodiment, the ATS block may receive a message by allocating a buffer in the memory and write the message into the buffer. The ATS block may also be configured to manage synchronization and schedule tasks for the CE.

Scalable autonomic message-transport with synchronization

A system includes a plurality of compute modules and a first processor configured to implement a virtualization layer, where the virtualization layer is configured to support real time jobs. The system also includes a hardware support layer coupled between the plurality of compute modules and the virtualization layer, where the hardware support layer is configured to provide an interface between the virtualization layer and the plurality of compute modules.

System and method for real time virtualization

A system and method for designing ICs, including the steps of: analyzing and optimizing a target IC design based on design-specific objectives; partitioning the optimized target IC design into pre-defined standard-cells from one or more libraries and creating design-specific cells specifically having unique functionality and characteristics not found amongst the standard-cells; identifying and determining a minimal subset of the standard-cells and design-specific cells, the interconnection of which represents the target IC design; generating the necessary views, including layout and characterizing of the design-specific cells included in a unique, minimal subset, wherein the IC design is subject to objectives and constraints of the target IC.

Method for automated design of integrated circuits with targeted quality objectives using dynamically generated building blocks

The present invention pertains to an automated method for designing a integrated circuit (IC) design-specific cell, the method includes the steps of receiving a design specification for the design-specific cell, mapping a transistor-level representation of the design-specific cell, wherein the mapping is based on at least one, but perhaps plural design specifications, and evaluating the transistor-level representation of the design-specific cell for satisfaction of the design specification.

Process for automated generation of design-specific complex functional blocks to improve quality of synthesized digital integrated circuits in CMOS using altering process

A method and system for constructing, designing, and using a family of logic circuits based on methods of interconnecting transistors (or more generally, switches). The method includes the selective use of functionally redundant transistors to achieve target objectives, such as speed of operation, power dissipation, control over switching capacitances, noise characteristics and signal integrity. In accordance with the present invention, multiple topologies may be incorporated into the implementation of a single dynamic transistor topology. The logic circuit family provides flexibility by implementing different topologies for the various functionally redundant sub-networks of transistors. The method is applicable to any network of transistors whose characteristics depend, at least in part, on its implementation topology.

Logic circuit having a functionally redundant transistor network

The present invention relates to a method for minimizing the number of standard cells required to implement a digital circuit and for improving the characterization of new standard cells based on their context/environment. In addition, a systematic method that utilizes detailed characterization at the transistor-level on critical areas of the design for improved characterization and optimization of the entire design is presented.

Context-sensitive constraint driven uniquification and characterization of standard cells

This invention is a testing technique for an electronic circuit such as an integrated circuit. The electronic circuit includes a JTAG test access port and at least one testable embedded core circuit having its own JTAG compliant second test access port. A test access port controller and a programmable switch control testing of the electronic circuit. An internal state in the test access port controller controls the switch state of the programmable switch. The programmable switch is controlled to selectively connect the first test access port to the embedded core circuits. When an embedded core circuit is connected for test, the test access port controller remains responsive to the first test access port and operates in a set of snoopy states corresponding to the state of the embedded core circuit under test. The test access port controller can regain control of the first test access port and disconnect all of the embedded core circuits when in snoopy states. The electronic circuit may include a non-testable embedded core circuit whose test is controller by the test access port controller.

Snoopy test access port architecture for electronic circuits including embedded core with built-in test access port

This invention is a testing technique for an electronic circuit such as an integrated circuit. The electronic circuit includes a JTAG test access port and at least one testable embedded core circuit having its own JTAG compliant second test access port. A test access port controller and a programmable switch control testing of the electronic circuit. An internal state in the test access port controller, such as bits in a data register, controls the switch state of the programmable switch. When an embedded core circuit is connected for test, the test access port controller remains responsive to the first test access port and operates in a set of snoopy states corresponding to the state of the embedded core circuit under test. The test access port controller can regain control of the test access port and disconnect all of the embedded core circuits when in snoopy states upon detection of a wake-up instruction loaded into a snoopy instruction register during a snoopy state corresponding to an instruction input state. Alternatively, a count of instruction bits more than the most bits for instruction input for any embedded core can trigger the wake-up function.

Snoopy test access port architecture for electronic circuits including embedded core having test access port with instruction driven wake-up

This invention is a testing technique for an electronic circuit such as an integrated circuit. The electronic circuit includes a JTAG test access port and at least one testable embedded core circuit having its own JTAG compliant second test access port. A test access port controller and a programmable switch control testing of the electronic circuit. An internal state in the test access port controller controls the switch state of the programmable switch. When an embedded core circuit is connected for test, the test access port controller remains responsive to the first test access port and operates in a set of snoopy states corresponding to the state of the embedded core circuit under test. The test access port controller can regain control of the first test access port when in snoopy states. At least one of the embedded core circuits includes a test access port controller for similar controlled connection to further embedded core circuits. Test of the entire electronic circuit invloves selection via the programmable switch of an embedded core circuit to test. The embedded programmable switch permits selection of one of the further embedded core circuits. This permits an previous integrated circuit design to be made into an embedded core circuit with no change in testability.

Growing community of inventors

Plano, TX, United States of America

Debashis Bhattacharya