Lockheed Missiles & Space Company, Inc.

Dean M Shough

George Gal

William Walter Anderson

Bruce J Herman

Rick A Williams

Edward D Huber

Rebecca L Welling

Osuk Y Kwon

A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured. Following optical measurement of the calibration fixture (38, 46), an optimization procedure is used to minimize the difference between the mechanically measured coordinates (x.sub.m, y.sub.m, z.sub.m) and the coordinates (x.sub.s, y.sub.s, z.sub.s) calculated from the optical measurements. The optimization procedure in the calibration method fixes the intrinsic and extrinsic parameters of the optical system (2, 8). A blending method can be used to increase the dynamic range of the measured intensity. Phase shifting is performed by either a method of temporal phase shifting or a method of spatial phase shifting.

Contour measurement system

Method of calibrating a three-dimensional optical measurement system

Wavefront correction apparatus for correcting a stepped wavefront output produced by certain angles of scan and by certain positions of scan in scanning microlens arrays includes anamorphic transfer optics with diffractive corrections. The transfer optics form the outputs of all of the unit cell trains of the microlens arrays into a unique, separate, linear image at each position of scan of the scanning array. A stepped wavefront corrector is positioned in the path of each linear image, and selected thicknesses of the material in the stepped wavefront corrector are effective to vary the times of optical passage through the stepped wavefront corrector in amounts to restore the wavefront to a continuous, unstepped form at the outlet of the plate.

Wavefront corrector for scanning microlens arrays

Growing community of inventors

Newark, CA, United States of America

Dean M Shough