Growing community of inventors

Bloomington, NY, United States of America

Dean G Bair

Average Co-Inventor Count = 4.28

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 177

Dean G BairEdward James Kaminski, Jr (11 patents)Dean G BairWilliam J Lewis (9 patents)Dean G BairRebecca Marie Gott (8 patents)Dean G BairCharles Franklin Webb (4 patents)Dean G BairChakrapani Rayadurgam (4 patents)Dean G BairChung-Lung K Shum (3 patents)Dean G BairJonathan T Hsieh (3 patents)Dean G BairMatthew G Pardini (3 patents)Dean G BairEugene S Rotter (3 patents)Dean G BairTimothy John Slegel (2 patents)Dean G BairMark S Farrell (2 patents)Dean G BairPak-kin Mak (2 patents)Dean G BairJennifer A Navarro (2 patents)Dean G BairBarry Watson Krumm (2 patents)Dean G BairWei-Yi Xiao (2 patents)Dean G BairLuis Alfonso Lastras-Montano (1 patent)Dean G BairPatrick James Meaney (1 patent)Dean G BairChristopher A Krygowski (1 patent)Dean G BairAaron Tsai (1 patent)Dean G BairMark Anthony Check (1 patent)Dean G BairBradley Nelson (1 patent)Dean G BairJohn Stephen Liptay (1 patent)Dean G BairVitali Sokhin (1 patent)Dean G BairEldee Stephens (1 patent)Dean G BairTom Kolan (1 patent)Dean G BairGil Eliezer Shurek (1 patent)Dean G BairRebecca S Wisniewski (1 patent)Dean G BairShiri Moran (1 patent)Dean G BairBruce Wile (1 patent)Dean G BairAlia Shah (1 patent)Dean G BairJames L Schafer (1 patent)Dean G BairThomas Ruane (1 patent)Dean G BairDean G Bair (22 patents)Edward James Kaminski, JrEdward James Kaminski, Jr (13 patents)William J LewisWilliam J Lewis (21 patents)Rebecca Marie GottRebecca Marie Gott (12 patents)Charles Franklin WebbCharles Franklin Webb (101 patents)Chakrapani RayadurgamChakrapani Rayadurgam (8 patents)Chung-Lung K ShumChung-Lung K Shum (358 patents)Jonathan T HsiehJonathan T Hsieh (39 patents)Matthew G PardiniMatthew G Pardini (4 patents)Eugene S RotterEugene S Rotter (3 patents)Timothy John SlegelTimothy John Slegel (415 patents)Mark S FarrellMark S Farrell (160 patents)Pak-kin MakPak-kin Mak (82 patents)Jennifer A NavarroJennifer A Navarro (25 patents)Barry Watson KrummBarry Watson Krumm (24 patents)Wei-Yi XiaoWei-Yi Xiao (7 patents)Luis Alfonso Lastras-MontanoLuis Alfonso Lastras-Montano (157 patents)Patrick James MeaneyPatrick James Meaney (137 patents)Christopher A KrygowskiChristopher A Krygowski (59 patents)Aaron TsaiAaron Tsai (51 patents)Mark Anthony CheckMark Anthony Check (46 patents)Bradley NelsonBradley Nelson (32 patents)John Stephen LiptayJohn Stephen Liptay (30 patents)Vitali SokhinVitali Sokhin (20 patents)Eldee StephensEldee Stephens (16 patents)Tom KolanTom Kolan (14 patents)Gil Eliezer ShurekGil Eliezer Shurek (13 patents)Rebecca S WisniewskiRebecca S Wisniewski (13 patents)Shiri MoranShiri Moran (10 patents)Bruce WileBruce Wile (7 patents)Alia ShahAlia Shah (2 patents)James L SchaferJames L Schafer (2 patents)Thomas RuaneThomas Ruane (2 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (22 from 164,108 patents)


22 patents:

1. 11748238 - Model-based biased random system test through rest API

2. 10678670 - Evaluating fairness in devices under test

3. 10671506 - Evaluating fairness in devices under test

4. 10289512 - Persistent command parameter table for pre-silicon device testing

5. 10061679 - Evaluating fairness in devices under test

6. 10055327 - Evaluating fairness in devices under test

7. 9990290 - Cache coherency verification using ordered lists

8. 9892010 - Persistent command parameter table for pre-silicon device testing

9. 9665280 - Cache coherency verification using ordered lists

10. 9665281 - Cache coherency verification using ordered lists

11. 9619312 - Persistent command parameter table for pre-silicon device testing

12. 9524801 - Persistent command parameter table for pre-silicon device testing

13. 8271932 - Hierarchical error injection for complex RAIM/ECC design

14. 7996203 - Method, system, and computer program product for out of order instruction address stride prefetch performance verification

15. 7559002 - Multi-thread parallel segment scan simulation of chip element performance

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