Micron Technology Incorporated

Dean C Eyres

Troy A Manning

Troy D Larsen

Martin L Culley

Jeffrey L Meader

Steve G Bard

The present disclosure includes apparatuses and methods for data compression and management. A number of methods include receiving a number of data segments corresponding to a managed unit amount of data, determining a respective compressibility of each of the number of data segments, compressing each of the number of data segments in accordance with its respective determined compressibility, forming a compressed managed unit that includes compressed and/or uncompressed data segments corresponding to the number of data segments corresponding to the managed unit amount of data, and forming a page of data that comprises at least the compressed managed unit.

Data compression and management

A method and system for testing a memory module that has at least a first and second memory bank. The first and second memory banks have a plurality of integrated circuit (IC) devices for storing data and the IC devices have a plurality of control lines coupled thereto. A first portion of the plurality of control lines are allocated to the IC devices of the first bank of the module. A second portion of the plurality of control lines are allocated to the IC devices of the second bank of the module. The IC devices of the first and second banks of the module are tested substantially simultaneously using the first and second portions of the plurality of control lines.

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Boise, ID, United States of America

Dean C Eyres