Micron Technology Incorporated

De Hua Guo

Jun Wang

Hua Fang Tan

Kun Liu

Junjun Wang

Kui Ding

Jia Ling Pan

Methods, systems, and devices for dynamic voltage supply for memory circuit are described. An apparatus may adjust a supply voltage based on a process corner and a temperature of the memory system. An apparatus may include a memory array and a controller. The controller may determine a first temperature of the apparatus is less than a first temperature threshold at a first time. The controller may transition a voltage supplied to the controller from a first voltage level to a second voltage level based on determining the first temperature is less than the first temperature threshold. The controller may determine a second temperature is greater than a second temperature threshold at a second time. The controller may transition the voltage supplied to the controller from the second voltage level to the first voltage level based on determining the second temperature is greater than the second temperature threshold.

Dynamic voltage supply for memory circuit

Methods, systems, and devices for error information storage for boot-up procedures are described. A memory system may detect an error associated with performing the boot-up procedure of the memory system and may store error information associated with the detected error in a persistent register at the memory system. In some cases, the memory system may additionally store the error information in a cache at the memory system. After storing the error information, the memory system may reset and, after resetting, may transfer the error information from the persistent register to a non-volatile memory device at the memory system. In cases that the memory system stores error information in the cache prior to the reset, the memory system may additionally transfer the error information from the cache to the non-volatile memory device.

Error information storage for boot-up procedures

Growing community of inventors

Shanghai, China

De Hua Guo