Koninklijke Philips Corporation N.v.

Dayu Chen

Ming Yan

Henk Goossens

This invention relates to a method and device for calibrating the offset of an imaging system. The core idea of the invention is to place a reference object in the measurement chamber of the imaging system, measure the signals associated with the reference object at different points of time, calculate the merit function based on changes of the parameters representing the electromagnetic property of the reference object, and derive an optimal set of offset data that minimizes the value of the merit function for compensating the offset of the system in subsequent image reconstructions. In one embodiment, the invention uses a reference object comprising a non-conductive envelope and a cavity which can be filled with a conductive fluid and emptied, and in this way reduces the imaging interference caused by the reference object during monitoring.

Method and device for calibrating a magnetic induction tomography system

The invention relates to a method and system for recording data by a plurality of laser beams (A, B) on an optical disc, said optical disc comprising segments which (-) are each identified by a synchronization pattern, said plurality of laser beams comprising at least a first laser beam (A) which has a first position on said optical disc for recording/reading data on a first segment and a second laser beam (B) which has a second position on said optical disc for recording data on a second segment, said method comprising the steps of: &#x2014;calculating () said second position from said first position and the relative distance between said first laser beam and said second laser beam, &#x2014;detecting () a synchronization pattern by said second laser beam, and &#x2014;starting () to record data with said second laser beam on the basis of said second position and said detected synchronization pattern.

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Shanghi, China

Dayu Chen