Marvell International Limited

Marvell Asia Pte., Ltd.

Davide Visani

Min Wu

Fernando De Bernardinis

Luca Vercesi

Yuanjie Chen

Mehedi Hasan

John Farley Ewen

Ahmed Mostafa

Paulo Isagani M Urriza

A method for determining a bit-error rate in data received on high-speed data channel that uses a forward-error-correcting decoder includes receiving at receiver circuitry on the high-speed data channel a received predetermined data pattern, comparing, bit-wise, the received predetermined data pattern to a locally generated copy of the predetermined data pattern to derive output bits representing whether there was an error in a corresponding bit of the received predetermined data pattern, to determine error bits in the received predetermined data pattern, grouping output bits from the comparing into symbols and codewords, and for each codeword for which a count of symbols containing errors exceeds a number of symbols correctable by the forward-error-correcting decoder, counting a total number of bit errors contained in the symbols containing errors, for use in adjusting the receiver circuitry in response to the total number of bit errors.

Method and apparatus for determining bit-error rate in a data channel

An analog-to-digital converter-based serial receiver configured to tune analog equalization settings for link training is described. An analog signal from a transmitter is received and the receiver applies initial analog equalization settings. The receiver then converts the equalized analog signal into a digital signal. The receiver then measures frequency content of the analog signal and saturation at the analog-to-digital converter and determines updated analog equalization settings.

Adaptive analog equalization in ADC-based receiver

Digital serializer/deserializer circuitry includes a data path and a date eye monitoring path. The data path includes a first analog-to-digital converter (ADC) to sample incoming data at a first rate, first digital filter circuitry to filter output of the first ADC, and a data slicer coupled to output of the first digital filter circuitry to output data above a threshold. The monitoring path includes a second ADC to sample the incoming data at a second rate lower than the first rate and to take samples at varying points along the incoming data waveform, second digital filter circuitry to filter output of the second ADC, and another data slicer coupled to output of the second digital filter circuitry to output data above an adjustable threshold and to sweep through varying threshold values. Error rate circuitry compares outputs of the data slicers to determine a data eye error rate.

ADC-based SerDes with sub-sampled ADC for eye monitoring

Embodiments described herein include methods and systems for measuring channel impulse responses in a digital communication system. Specifically, statistical properties of the received signals at the receiver of the digital communication system are analyzed to compute, in real time, channel coefficients indicative of the channel state information, which may be time-dependent, without the use of a training signal.

Systems and methods for measuring impulse responses in a digital communication system

An apparatus comprises a plurality of Analog to Digital Converter circuits (ADCs) and a skew detector configured to determine a plurality of indicators corresponding to a plurality of sampling time skews of the plurality of ADCs, respectively. The plurality of ADCs is configured to adjust the plurality of sampling time skews according to the plurality of indicators, respectively. The apparatus is configured to reach an equilibrium state wherein the plurality of indicators are substantially equal. In an embodiment, the apparatus comprises a Time-Interleaved ADC including the plurality of ADCs. A method comprises measuring a plurality of indicators of a plurality of sampling time skews, respectively. The plurality of sampling time skews are associated with a plurality of ADCs, respectively. The plurality of sampling time skews are adjusted according to respective indicators of the plurality of indicators.

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San Jose, CA, United States of America

Davide Visani