Intel Corporation

Micron Technology Incorporated

Davide Mantegazza

Kiran Pangal

Derchang Kau

Feng Q Pan

Sandeep K Guliani

Balaji Srinivasan

Prashant S Damle

Hernan Adolfo Castro

Davide Fugazza

John Gorman

Hanmant Pramod Belgal

Dany-Sebastien Ly-Gagnon

Kyung Jean Yoon

Gerard H Joyce

Fabio Pellizzer

Andrea Redaelli

Sanjay Rangan

Srivatsan Venkatesan

Abhinav Pandey

Iniyan Soundappa Elango

John Gormann

A selection scheme for crosspoint memory is described. In one example, the selection voltage applied across the memory cell is slowly ramped up. Once the memory cell thresholds, the voltage is reduced to a level for performing the read or write operation. Reducing the voltage once the specific cell has been selected (e.g., thresholds) minimizes the additional transient current which might be generated by further increasing the selection bias applied during read or write operation. The reduction in transient current can lead to an improvement in read disturb and write endurance issues. The selection ramp-rate and bias post-selection can be set differently depending on the cell location inside the memory array to further improve cell performance.

Selection scheme for crosspoint memory

Various embodiments of a three-dimensional cross-point (3D X-point) memory cell design include one or more electrodes having an increased resistance compared to existing memory cell designs or compared to other electrodes within a same memory cell. A memory device includes an array of memory cells with each memory cell arranged between a word line and a bit line of the memory device. Some embodiments include additional material layers to increase memory cell resistance. Some embodiments include electrodes having an increased thickness to increase the resistance. Some embodiments include electrodes having a composition with a higher resistivity. Some embodiments include electrodes with increased interface resistance. Some embodiments include a combination of such features. In any case, the resulting increased memory cell resistance causes a reduction in the transient selection current for the given memory cell.

Memory device with increased electrode resistance to reduce transient selection current

Examples may include techniques to mitigate errors during a read operation to a memory cell of a memory array. Examples include selecting the memory cell and applying one of multiple demarcation read voltages for respective multiple time intervals to sense a state of a resistive storage element of the memory cell. Examples also include applying a bias voltage to the memory cell following a sense interval to mitigate read disturb to the resistive storage element incurred while the one of the multiple demarcation read voltages was applied to the memory cell.

Techniques to mitigate error during a read operation to a memory array

A high current fast read scheme can enable improved read disturb without negatively impacting read performance. In one example, a fast read scheme involves applying a higher current as soon as the cell thresholds. In one example, circuitry detects the threshold event and turns on a bypass control transistor to bypass the circuitry applying the read voltage to enable a higher voltage and therefore higher current as soon as possible. The read time can thus be decreased (or at least not increased) and read disturb improved.

High current fast read scheme for crosspoint memory

Examples may include techniques to improve a read operation to a memory array. Examples include identifying characteristics of memory cells in the memory array such as relative positions of memory cells within the memory array and then set multiple read reference voltages or currents to detect a memory state of memory cells based on identified characteristics.

Techniques to improve a read operation to a memory array

Techniques for accessing multi-level cell (MLC) crosspoint memory cells are described. In one example, a circuit includes a crosspoint memory cell that can be in one of multiple resistive states (e.g., four or more resistive states). In one example, to perform a read, circuitry coupled with the memory cell applies one or more sub-reads at different read voltages. For example, the circuitry applies a first read voltage and detects if the memory cell thresholds in response to the first read voltage. If the memory cell thresholded in response to the first read voltage, the state of the memory cell can be determined without further reads. If the memory cell did not threshold in response to the first read voltage, a second read voltage with a greater magnitude is applied across the memory cell. If the memory cell thresholded in response to the second read voltage, the state of the memory cell can be determined without further reads. If the memory cell did not threshold in response to the first read voltage, a third read voltage with a greater magnitude is applied across the memory cell. In one example, the thresholding of the memory cell triggers the application of a write current to write back the state of the bit due to read disturb from the read.

Multi-level cell (MLC) techniques and circuits for cross-point memory

Threshold switching devices demonstrating transient current protection through both insulation and repair current mechanisms, including associated systems and methods, are provided and discussed.

Transient current-protected threshold switching devices systems and methods

Apparatuses for increasing the voltage budget window of a memory array are described. One or more pre-bias voltages may be applied across a selected cell by providing voltages to memory access lines coupled to the selected cell. The threshold voltage of the selected cell may decrease responsive to the pre-bias voltage. Conversely, threshold voltage of deselected cells coupled to only one of the memory access lines coupled to the selected cell may increase responsive to the pre-bias voltage. The decrease of the threshold voltage of the selected cell and the increase of the threshold voltage of the deselected cells may increase the voltage window of the memory array.

Apparatuses for modulating threshold voltages of memory cells

Methods and apparatuses for increasing the voltage budget window of a memory array are disclosed. One or more pre-bias voltages may be applied across a selected cell by providing voltages to memory access lines coupled to the selected cell. The threshold voltage of the selected cell may decrease responsive to the pre-bias voltage. Conversely, threshold voltage of deselected cells coupled to only one of the memory access lines coupled to the selected cell may increase responsive to the pre-bias voltage. The decrease of the threshold voltage of the selected cell and the increase of the threshold voltage of the deselected cells may increase the voltage window of the memory array.

Methods and apparatuses for modulating threshold voltages of memory cells

A disclosed example to reduce a threshold voltage drift of a selector device of a memory cell includes providing an applied voltage to the selector device of the memory cell, the applied voltage being less than a threshold voltage of the selector device, and reducing the threshold voltage drift of the memory cell by maintaining the applied voltage at the selector device for a thresholding duration to activate the selector device.

Methods and apparatus to reduce threshold voltage drift

An apparatus is provided which comprises: a plurality of memory cells; a bias logic coupled with at least one memory cell of the plurality, the bias logic to: apply a first read voltage to the at least one memory cell; and apply a second read voltage to the at least one memory cell, the first read voltage being higher than the second read voltage; and a first circuit operable to float a word-line coupled to the at least one memory cell before the bias logic applies the first read voltage to the at least one memory cell. A method is provided which comprises: performing a first read operation to at least one memory cell; and performing a second read operation to the at least one memory cell after the first read operation completes, wherein the second read operation is different from the first read operation.

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Palo Alto, CA, United States of America

Davide Mantegazza