International Business Machines Corporation

David Wen-Hao Shan

Phillip John Restle

Thomas J Bucelot

Robert Louis Franch

Christos Vezyrtzis

Joseph N Kozhaya

A clock driver control scheme for a resonant clock distribution network provides robust operation by controlling a pulse width of the output of clock driver circuits that drive the resonant clock distribution network so that changes are sequenced. The clock driver control circuit controls the clock driver circuits in the corresponding sector according to a selected operating mode via a plurality of control signals provided to corresponding clock driver circuits. The pulse widths differ for at least some of the sectors during operation of digital circuits within the integrated circuit having clock inputs coupled to the resonant clock distribution network. The different pulse widths may be a transient difference that is imposed in response to a mode or frequency change of the global clock that provides an input to the clock driver circuits.

Sequenced pulse-width adjustment in a resonant clocking circuit

A pulse-drive resonant clock with on-the fly mode changing provides robust operation in a resonant clock distribution network, in particular for processor circuits having a dynamically-varied operating frequency. The clock drivers for the resonant clock distribution network include a pulse width control circuit having selectable operating modes corresponding to multiple clocking modes of the resonant clock distribution network. The pulse width control circuit includes a delay line that has a selectable delay length to provide pulse enable signals that control the pulse widths of the clock drivers in a sector of the resonant clock distribution network. The delay line responds to a mode control signal so that at least one pulse width of the output is changed from a first pulse width to a second pulse width without generating half-cycles with a pulse width narrower than the first or second pulse width.

Pulse-drive resonant clock with on-the-fly mode change

A delay measurement technique using a tapped delay line edge capture circuit that captures tap position of edges within the delay line provides accuracy of measurement to one pico-second and below. A control circuit causes latches to capture an edge of a signal delayed through the delay line at taps of the delay line. The frequency of a clock from which the signal is derived is adjusted and tap outputs are captured by latches and averaged. A first frequency is found at which the average edge position is midway between two adjacent tap positions. A second signal, which may be the reference signal that clocks the latches, is propagated through the delay line and a second frequency is found for which the average edge position lies at the boundary between the two tap positions. The delay is determined from the difference between the periods of the first frequency and the second frequency.

Measurement of signal delays in microprocessor integrated circuits with sub-picosecond accuracy using frequency stepping

High performance clock distributions and similar wiring networks require improvements in reliability and performance. This is especially true when hierarchical wiring with different metal thicknesses is employed and when a smaller number of large, higher-power buffers are used to reduce timing variability. Routing of critical nets improves robustness, reliability, and resistance while minimizing track and power usage. The method further optimizes the use of multiple physical pins on buffers to achieve desired electrical criteria. This involves optimal selection of additional routing beyond what is needed to satisfy simple connectivity. The routing involves an iterative process to select and evaluate additional possible routes on multiple layers. Each iteration involves extraction and simulation or estimation, and additional routes are added until the desired electrical criteria are met.

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Austin, TX, United States of America

David Wen-Hao Shan