Teradyne, Inc.

David Walter Lewinnek

Brian J Bosy

Roger Allen Sinsheimer

Luis Antonio Valiente

Craig Anthony DiPalo

Eric Lenhart Truebenbach

Cameron Dee Dryden

Michael A Chiu

Vladimir Vayner

Richard Pye

Jack Michael Thompson

John Kenji Narasaki

Ray Mirkhani

Charles M Sweet

Seth E Mann

David F High

An example system includes a circuit board having electrical elements; a wafer having contacts; and an interconnect to route signals between the electrical elements and the contacts. The interconnect includes multiple layers, each of which includes a flexible circuit. The flexible circuit includes a conductive trace disposed thereon. The interconnect also includes shielding between adjacent layers of the multiple layers. The shielding is electrically connected to ground.

Coaxial structure for transmission of signals in test equipment

A system includes: a circuit board including electrical elements arranged at a first pitch; a wafer including contacts arranged at a second pitch, where the second pitch is less than the first pitch; and an interconnect including additively-manufactured electrical conduits that are part of an electrical pathway between the electrical elements and the contacts, where the additively-manufactured electrical conduits include electrically-conductive material.

Interconnect for transmitting signals between a device and a tester

An example system for testing camera modules includes: a structure for holding camera modules under test, where each of the camera modules includes an image sensor, and where the camera modules are arranged in a same plane on the structure and offset from each other in the plane; and a target for use in testing the camera modules concurrently, where the target includes multiple tiles that are repeated, where each tile contains information for use in testing a camera module, and where the camera modules and the tiles are arranged so that different camera modules face different tiles but see at least some of the same information at the same angle.

Matrix testing targets

An example system for testing camera modules may include: a polygonal structure that is rotatable, where the polygonal structure includes faces, each of which is configured to receive at least one camera module under test; and targets facing at least some of the faces of the polygonal structure, where each target is usable in testing a corresponding camera module facing the each target.

Rotatable camera module testing system

A system includes electronics for testing a device, a reservoir to store coolant, where the reservoir includes a bellows that is compressible, a pump system to move coolant out of the reservoir to cool the electronics, and means to compress the bellows and thereby pressurize the coolant stored in the reservoir so that the coolant remains substantially flush with an interface to the pump system.

Liquid cooling during testing

An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.

Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head

A manipulator for supporting heavy as well as lighter test heads in a small footprint includes a body and an interface for supporting a test head from behind. The interface includes a first portion fixedly attached to the body and a second portion fixedly attached to the rear of the test head. The first and second portions of the interface are rotatably coupled together to allow rotation of the test head about its approximate center of mass. Although the weight of the test head is entirely borne from the rear, the test head can still be moved with relatively little applied force, thereby satisfying the requirements for compliant docking.

Rear-mounted gimbal for supporting test head

A probe tower for an automatic test system includes an insulative retainer for holding an array of differential probe assemblies. Each differential probe assembly is an elongated structure having first and second ends and first and second coaxial portions. Each coaxial portion includes an outer conductor and a pair of annular insulators positioned therein for holding a center conductor. First and second contact pins extend from the center conductor at the first and second ends, respectively. First and second ground pins, which are electrically connected to the outer conductors of the first and second coaxial portions, extend from the first and second ends for conveying ground connections.

Differential coaxial contact array for high-density, high-speed signals

A docking mechanism for docking a test head with a peripheral includes a latching mechanism that extends from a pneumatically actuated piston. The latching mechanism includes a latch barrel, a latchpin, and a biasing spring. The latchpin moves within the latch barrel for establishing latched and unlatched positions. An application of fluid pressure to the latchpin via a first fluid path causes the latchpin to advance to the latched position. A release of fluid pressure from the first path causes the latchpin to retract, in compliance with the biasing spring, to the unlatched position. An application of fluid pressure via a second fluid path to a surface of the piston causes the latching mechanism as a whole to retract. When the test head and peripheral are latched together, this retraction causes the peripheral to be pulled down against the test head, and thus causes electrical connections to be formed between the test head and a device under test. Because the docking mechanism is actuated by fluid pressure, it can be constructed with a very low profile, to have a relatively small impact on the placement of other equipment in its area. Because it unlatches upon the release of fluid pressure, the docking mechanism allows a test head and a peripheral to be easily separated upon an accidental loss of power.

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Somerville, MA, United States of America

David Walter Lewinnek