Tektronix, Inc.

David W Simmen

Ira G Pollock

James H McGrath, Jr

Mark W Nightingale

R Kenneth Price

Phillip D Applebee

A zero insertion force (ZIF) connector can include a connector housing defining an opening and an interior space for receiving a mating member, multiple LIGA springs positioned within the interior space and configured to apply pressure to the mating member while in a first position, and a locking component to cause the LIGA springs to move to a second position responsive to a user pressing the locking component. The LIGA springs do not apply pressure to the mating member while in the second position.

High performance LIGA spring interconnect system for probing application

A multiport zero insertion force (ZIF) connector can include a multiport connector housing defining an opening and an interior space for receiving a multi-path circuit device having multiple types of electrical connection paths therethrough and multiple LIGA springs positioned within the interior space to apply pressure to the multi-path circuit device while in a first position. A locking component can be configured to cause the LIGA springs to move to a second position responsive to a user pressing the locking component, wherein the LIGA springs do not apply pressure to the multi-path circuit device while in the second position.

High performance multiport connector system using LIGA springs

An attachable/detachable probe point for use with an electrical measurement probe includes a base having a aperture formed therein that extends through the base. An electrically conductive probing contact having at least a partially threaded body member and a pointed contact member is disposed in the aperture with a portion of the body member extending from the top surface of the base and the pointed contact member extendable from a first position within the aperture to a second protruding position outside the aperture at the bottom surface of the base. A compliant adhesive material formed on the bottom surface of the base for securing the attachable/detachable probe point to probing contact point.

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Portland, OR, United States of America

David W Simmen