International Business Machines Corporation

Globalfoundries Inc.

David W Milton

Clarence Rosser Ogilvie

Robert Dov Herzl

Paul Mark Schanely

Tad Jeffrey Wilder

Robert J Devins

Christopher Douglas Hanudel

Margaret R Charlebois

Robert Spencer Horton

Charles B Winn

Kenneth Anthony Lauricella

Nitin Sharma

Kenneth A Mahler

Pascal A Nsame

Jack Robert Smith

Mark William Kuemerle

Andrew E Davis

Peter Dean LaFauci

Jason Edward Rotella

Malede Wondmagegne Berhanu

Paul J Ferro

Sebastian Theodore Ventrone

Gary Douglas Grise

Mark E Kautzman

Rashmi D Chatty

Matthew P Szafir

David E Lackey

Vikram Iyengar

Douglas P Nadeau

Mark R Taylor

W Riyon Harding

Paul G Ferro

Marc R Turcotte

Henry R Farmer

Embodiments of the invention provide a method, system, and program product for predicting a delay of a critical path. In one embodiment, the invention provides a method of predicting a delay of at least one critical path of an integrated circuit, the method comprising: determining a delay of at least one ring oscillator on the integrated circuit; and calculating a predicted delay for the at least one critical path delay based on a delay of components of the critical path at a corner condition, a wire delay of the at least one critical path, a delay of the at least one ring oscillator at a corner condition, and the determined delay of the at least one ring oscillator.

Critical path delay prediction

Disclosed are a chip performance monitoring system, method and a computer program product, wherein a performance monitor output signal is propagated through an adjacent scan chain to avoid signal degradation incident to across-chip transmission of high frequency signals. Since the clock signal frequency used to control signal propagation through the scan chain will typically be less than twice the performance monitor output signal frequency, frequency sub-sampling with aliasing occurs. To compensate, signal propagation through the scan chain can be controlled during different time periods using different clock signals having different clock signal frequencies and, during these different time periods, different data outputs can be captured at an output node of the scan chain. The data output frequencies of these different data outputs can be measured and the performance monitor output signal frequency can be determined based on the different data output frequencies given the different clock signal frequencies.

Chip performance monitoring system and method

A method and system comprises transferring data from a first processor to at least one pulse generator directly connected to an interrupt control of at least a second processor. The transferring of the data bypasses memory. The method further includes reading the transferred data directly from the at least one pulse generator by the at least a second processor.

Method and system of communicating between peer processors in SoC environment

Aspects of the invention provide for a flexible performance screen ring oscillator (PSRO) integrated within a scan chain. In one embodiment, a circuit structure to create the flexible PSRO includes: a plurality of programmable scan chain elements; and a forward test scan chain path through the plurality of scan chain elements; wherein each of the programmable scan chain elements includes additional circuitry for a backward path, such that the backward path and the forward test scan chain path are combined to create the PSRO.

Flexible performance screen ring oscillator within a scan chain

A performance screen ring oscillator (PSRO) formed from paired scan chains is disclosed. A circuit structure comprises scan chains each having scan chain elements. A scan chain link is configured to pair at least one scan chain element from a first scan chain with at least one scan chain element of a second scan chain to form a PSRO. A forward path associated with data flow through the at least one scan chain element of the first scan chain becomes a backward path of the at least one scan chain element of the second scan chain, and a forward path associated with data flow through the at least one scan chain element of the second scan chain becomes a backward path of the at least one scan chain element of the first scan chain.

Performance screen ring oscillator formed from paired scan chains

A performance screen ring oscillator (PSRO) is formed from multi-dimensional pairings of scan chains. In one embodiment, there is a multi-dimensional arrangement of scan chains in an integrated circuit. Each of the scan chains has interconnected scan chain elements that form a shift register to apply test patterns to inputs of combinational logic in the integrated circuit and read outputs from the combinational logic based on the inputted test patterns. A scan chain link links selected scan chain elements from the scan chains to form at least one PSRO loop within the multi-dimensional arrangement of the scan chains.

Performance screen ring oscillator formed from multi-dimensional pairings of scan chains

Aspects of the invention provide a circuit structure that automatically monitors a plurality of ring oscillators and dynamically selects the fastest or the slowest ring oscillator for feedback into the plurality of ring oscillators. In one embodiment, a circuit includes: a plurality of delay elements, each delay element associated with a ring oscillator; a first logic gate for receiving outputs of each of the delay elements; a second logic gate for receiving outputs of each of the delay elements; and a multiplexer for receiving an output of the first logic gate and an output of the second logic gate and choosing one of the outputs, wherein a selection for the multiplexer is based on an output of the multiplexer. To select the fastest ring oscillator, a second multiplexer is provided.

Ring oscillator

Disclosed is a differential clock signal generator which processes a first differential clock signal using a combination of differential and non-differential components to generate a second differential clock signal. Specifically, the first differential clock signal is converted into a single-ended clock signal, which is used either by a finite state machine to generate two single-ended control signals or by a waveform generator to generate a single-ended waveform control signal. In any case, a deskewer, which comprises a pair of single-ended latches and either multiplexer(s) or logic gates, processes the first differential clock signal, the single-ended clock signal, and the control signal(s) in order to output a second differential clock signal that is different from the first differential clock signal in terms of delay and, optionally, frequency, but synchronously linked to it.

Differential clock signal generator

A method for designing an integrated circuit. A computer determines, for one or more paths in a circuit design, for a value of a design variable at which timing closure of the circuit design is achieved, an approximate slope of a function representing path delay as a function of the design variable. When the computer determines that one of the approximate slopes is not within a defined slope range, the computer determines an adjustment direction and an adjustment value based in part on the magnitude by which the slope is not within the defined slope range. The computer changes the circuit design of the path associated with the out-of-range slope, based in part on the adjustment direction and the adjustment value, so as to bring the slope within the defined slope range.

Circuit design using design variable function slope sensitivity

A method and circuit for dynamically changing the frequency of clock signals. The method including: detecting an edge of a first clock signal operating at a first frequency using a second clock signal operating at a second frequency; detecting an edge of the second clock signal using the first clock signal; detecting coincident edges of the first and the second clock signals; and changing the second frequency to a third frequency different from the second frequency upon detection of the coincident edges.

Method and circuit for dynamically changing the frequency of clock signals

A method of forming and electrical structure. The method includes determining that a first semiconductor device requires an engineering change order (ECO). An additional structure layer required to implement the ECO is determined. A first insertion point location for inserting the additional structure layer within the first semiconductor device is selected. The first insertion point location is associated with a second insertion point location within a design for a second semiconductor device. The second semiconductor device is generated in accordance with the first ECO. The second semiconductor device comprises second structures. The second structures comprise same structures as first structures in the first semiconductor device. The second structures are formed in locations within the second semiconductor device that are associated with locations in the first semiconductor device comprising the first structures. The second semiconductor device comprises the additional structure layer located within the second insertion point location.

Semiconductor layer forming method and structure

A structure for performing cross-chip communication with mesochronous clocks. The structure includes: a data delay line; a remote clock delay line; a structure that captures at least one value of a state of a delayed remote clock signal on the remote clock delay line; and a control that influences a delay associated with the data delay line and the remote clock delay line.

Method, circuit, and design structure for capturing data across a pseudo-synchronous interface

A method for source synchronous communication. The method includes dynamically adjusting a delay that is applied to a data signal and a remote clock signal until a delayed remote clock signal is synchronized with a local clock signal, and capturing data from a delayed data signal associated with the delay in a local domain.

A chip design methodology. The methodology includes identifying engineering changeable logic, and replacing the identified engineering changeable logic with flexible logic blocks (FLB).

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Underhill, VT, United States of America

David W Milton