Malvern Panalytical Inc.

Malvern Instruments Limited

David Stringfellow

Jason Corbett

Nigel Lightfoot

Jason Cecil William Corbett

David Michael Spriggs

Rhys Poolman

Lewis Jones

Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. The detector elements are arranged to measure the intensity of scattered light at a plurality of scattering angles, the plurality of scattering angles distributed over a plurality of angles about an illumination axis. Identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant comprises identifying measured scattered light that is asymmetric about the illumination axis.

Thermal compensation

An apparatus for providing a light beam for use in a diffraction instrument () includes a device () for generating a light beam; and means () for shaping the light beam generated by the device (), dimensioned, in use, to determine the beam shape, and including: an aperture () and means () for rejecting spatial frequency components above a certain range in the light beam. The apparatus further includes a spatial low-pass filter () arranged to filter a beam provided by the beam shaping means.

Apparatus and method of producing a light beam for an optical measurement instrument

In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam.

Broad-range spectrometer

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Malvern, United Kingdom

David Stringfellow