Sri International

USA as Represented by Secretary of the Navy

David S Stoker

Brett J Hamilton

Motilal Agrawal

Cregg Cowan

Jan E Van Der Laan

John Brian Burns

Erik Frank Matlin

Neil William Troy

James R Potthast

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.

Method and apparatus for conducting automated integrated circuit analysis

The present invention relates to a method and apparatus for long-range facial and ocular acquisition. One embodiment of a system for acquiring an image of a subject's facial feature(s) includes a steerable telescope configured to acquire the image of the facial feature(s), a first computational imaging element configured to minimize the effect of defocus in the image of the facial feature(s), and a second computational imaging element configured to minimize the effects of motion blur. In one embodiment, the detecting, the acquiring, the minimizing the effect of the motion, and the minimizing the effect of the defocus are performed automatically without a human input.

Method and apparatus for automatically acquiring facial, ocular, and iris images from moving subjects at long-range

Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.

Dual magnification apparatus and system for examining a single objective in a scanning optical microscope using two wavelengths of light

The present invention relates to a method and apparatus for standoff facial and ocular acquisition. Embodiments of the invention address the problems of atmospheric turbulence, defocus, and field of view in a way that minimizes the need for additional hardware. One embodiment of a system for acquiring an image of a facial feature of a subject includes a single wide field of view sensor configured to acquire a plurality of images over a large depth of field containing the subject and a post processor coupled to the single sensor and configured to synthesize the image of the facial feature from the plurality of images.

Growing community of inventors

Belmont, CA, United States of America

David S Stoker