Growing community of inventors

Los Gatos, CA, United States of America

David S Hendrickson

Average Co-Inventor Count = 3.43

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 119

David S HendricksonJovan Jovanovic (14 patents)David S HendricksonDonald Paul Richmond, Ii (10 patents)David S HendricksonScott E Lindsey (10 patents)David S HendricksonSteven C Steps (2 patents)David S HendricksonAlberto Calderon (2 patents)David S HendricksonWilliam D Barraclough (2 patents)David S HendricksonBradley R Gunn (2 patents)David S HendricksonDavid S Hendrickson (16 patents)Jovan JovanovicJovan Jovanovic (56 patents)Donald Paul Richmond, IiDonald Paul Richmond, Ii (54 patents)Scott E LindseyScott E Lindsey (50 patents)Steven C StepsSteven C Steps (22 patents)Alberto CalderonAlberto Calderon (12 patents)William D BarracloughWilliam D Barraclough (3 patents)Bradley R GunnBradley R Gunn (2 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Aehr Test Systems, Inc. (14 from 87 patents)

2. Aehr Test Ststems (1 from 1 patent)

3. Aerh Test Systems (1 from 1 patent)


16 patents:

1. 12326472 - System for testing an integrated circuit of a device and its method of use

2. 11448695 - System for testing an integrated circuit of a device and its method of use

3. 10677843 - System for testing an integrated circuit of a device and its method of use

4. D875579 - Layout of contacts

5. 10488437 - Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode

6. D850309 - Layout of contacts

7. 9874583 - Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode

8. 9250291 - System for testing an integrated circuit of a device and its method of use

9. 8986048 - Integrated feedthrough module

10. 8228085 - System for testing an integrated circuit of a device and its method of use

11. 7969175 - Separate test electronics and blower modules in an apparatus for testing an integrated circuit

12. D630166 - Connector

13. D629760 - Interface on an electronics connector

14. 7800382 - System for testing an integrated circuit of a device and its method of use

15. 7063544 - System for burn-in testing of electronic devices

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as of
12/29/2025
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