Polyvalor, Societe En Commandite

Photon Etc, Inc.

David Rioux

Michel Meunier

Daniel Oyama

There are provided infrared imaging systems and methods for imaging a sample with fluorescent markers. The system includes a light source configured to illuminate a sample-contacting surface. The light source includes first and second illumination modules, each configured to project a corresponding first and second infrared illumination beam towards a sample holder, the infrared illumination beams interacting at an imaging plane to define an illumination area having a rectangular and homogeneous power profile. The system also includes a control unit operatively connected to a motor assembly and to an optomechanical mechanism. The control unit is configured to superimpose the sample plane and the imaging plane at any of the multiple locations within the enclosure. The system includes a detector configured to receive light emitted by the fluorescent markers of the sample upon illumination of the same in the imaging plane when the sample plane is superimposed with the imaging plane.

Infrared imaging system and related method

There is provided a process for preparing alloy nanoparticles having a desired size. The process comprises a combination of co-reduction of metal salts in the presence of a reducing agent, and multi-step seeded growth synthesis. Also provided is a material which comprises alloy nanoparticles made of at least two metals. A mean diameter of the particles of the material is between about 30 nm and 200 nm as measured by transmission electron microscopy (TEM), and the particles have a coefficient of variation smaller than about 15%.

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Montreal, Canada

David Rioux