Growing community of inventors

Beaverton, OR, United States of America

David Randle Hess

Average Co-Inventor Count = 2.53

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 43

David Randle HessPeter Douglas Andrews (6 patents)David Randle HessRobert New (2 patents)David Randle HessSia Choon Beng (1 patent)David Randle HessAnthony James Lord (1 patent)David Randle HessGavin Neil Fisher (1 patent)David Randle HessPeter Andrews (1 patent)David Randle HessDavid Michael Newton (1 patent)David Randle HessChunyi Yin Leong (1 patent)David Randle HessDavid Randle Hess (8 patents)Peter Douglas AndrewsPeter Douglas Andrews (11 patents)Robert NewRobert New (2 patents)Sia Choon BengSia Choon Beng (8 patents)Anthony James LordAnthony James Lord (7 patents)Gavin Neil FisherGavin Neil Fisher (5 patents)Peter AndrewsPeter Andrews (1 patent)David Michael NewtonDavid Michael Newton (1 patent)Chunyi Yin LeongChunyi Yin Leong (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Cascade Microtech, Inc. (5 from 248 patents)

2. Formfactor, Inc. (2 from 506 patents)

3. Formfactor Beaverton, Inc. (1 from 17 patents)


8 patents:

1. 11821912 - Methods of producing augmented probe system images and associated probe systems

2. 11016121 - Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test

3. 10365323 - Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change

4. 9435858 - Focusing optical systems and methods for testing semiconductors

5. 7940069 - System for testing semiconductors

6. 7898281 - Interface for testing semiconductors

7. 7656172 - System for testing semiconductors

8. 7535247 - Interface for testing semiconductors

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as of
12/8/2025
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