Agilent Technologies, Inc.

David Poppe

Allen Montijo

Christopher P Duff

Marty Grove

Vivian Patlin

A measurement system for analyzing data values that are stored in memory and that represent a sampled electrical signal under analysis (SUA). Each of the data values represents the SUA at respective points in time over a time interval during which the SUA was sampled. The stored data values constitute a main data record. The system includes processing logic that is configured to generate at least a first reduced data record from the main data record. The first reduced data record comprises a subset of the data values of the main data record. The first reduced data record is processed by the processing logic to locate an edge (i.e., a voltage transition) in the first reduced data record. Thus, it is not necessary that the main data record, which is more voluminous than the first reduced data record, be used to locate the edge. After the edge has been located, the processing logic processes a second set of data values of the main data record that is within boundaries in the main data record associated with the first reduced data set in order to analyze the edge. Thus, it is not necessary to process the entire main data record in order to analyze, or evaluate, an edge. Once the edge has been suitable located, all of the data of the main data record that is associated with the edge may be processed to analyze the edge.

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Colorado Springs, CO, United States of America

David Poppe