Hewlett-packard Development Company, L.p.

David Orr

Daniel Robert Blakley

Jon Brewster

Steven J Simske

David Michael Kwasny

John M Koegler, Iii

Jian-Gang Weng

Lonnie D Mandigo

A system and method for controlling one or more remote sensors includes wirelessly communicating with the sensors, monitoring operation of each one of the sensors, and causing any one of the sensors that is operating in an unauthorized manner to be disabled. In one embodiment, the sensors can include micro-mechanical structure supporting electronic circuitry. The electronic circuitry is capable of monitoring at least one performance parameter of the sensor, comparing the monitored parameter to a preset limit, and disabling the sensor if the preset performance limit is exceeded.

System and method for controlling remote sensors

A security printing method includes generating a security file having a plurality of metadata fields and an information field concatenated together in an initial sequence. A security file identification is generated from the plurality of metadata fields and the information field. The security file identification corresponds to the initial sequence and is a one-way function of the plurality of metadata fields and the information field. The method further includes selecting a custom scrambling technique based on the security file identification, and scrambling the initial sequence using the selected custom scrambling technique, thereby creating a scrambled sequence of the plurality of metadata field and the information field.

Security printing method and system for enhancing security printing

A flow direction detector is provided which includes a flow disruptor positioned in a fluid flow path to effect a detectable differential flow characteristic to such flow path based on fluid flow direction, and a sensor arrangement configured to detect such detectable differential flow characteristic within the flow path.

Flow direction detector

An exemplary solution-processed thin film transistor formation method of the invention forms solution-processed thin film layers into a transistor structure. During formation, semiconductor portions of the transistor structure are selectively heated via a laser to modify the material state of semiconductor material from a solution deposited material state to a thin film layer material state.

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Philomath, OR, United States of America

David Orr