Unisys Corporation

David M Hime

Duane A Schroeder

A test circuit for two level latches on an integrated circuit to be tested includes a test enable driver circuit coupled to a third level switch which is connected in series between the latches to be tested and a low voltage source. The third level switch converts the two level latches to be tested into a buffer such that data applied as an input to the two level latches appears in identical form as data at the output pin of the integrated circuit chip.

Growing community of inventors

Blaine, MN, United States of America

David M Hime