Analog Devices International Unlimited Company

Analog Devices Global

David M Boland

Alan J O'Donnell

Edward John Coyne

David J Clarke

David Aherne

Shaun Bradley

Mark Forde

Colm Patrick Heffernan

Kevin B Manning

Michael A Looby

Patrick Martin McGuinness

Thomas G O'Dwyer

Stephen Denis Heffernan

Nijun Wei

The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.

Wearable device with energy harvesting

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Lifetime indicator system

Spark gap structures for detection and protection against electrical overstress events

Exposure monitor device

Wear-out monitor device

Growing community of inventors

Limerick, Ireland

David M Boland