Synopsys, Inc.

Atrenta, Inc.

Sequence Design, Inc.

Apache Design Solutions, Inc.

Sente, Inc.

David L Allen

Kaushik De

Adi Srinivasan

Rajarshi Mukherjee

Paras Mal Jain

Gerald L Frenkil

Bhaskar Pal

Sanjay Gulati

Malitha Kulatunga

Sachin Bansal

Christopher W Kapral

Gaurav Pratap

Lorne J Cooper

Nishant Patel

Thomas J Miller

Disclosed herein are system, computer-readable storage medium, and method embodiments of machine-learning (ML)-based static verification for derived hardware-design elements. A system including at least one processor may be configured to extract a feature set from a hardware description and evaluate a similarity index of a first hardware element with respect to a second hardware element, using an ML process based on the feature set, wherein the first hardware element is described in the hardware description. The at least one processor may be further configured to update one or more parameters corresponding to a static verification of the hardware description while the static verification is being performed, by providing at least one test attribute, corresponding to the second hardware element, applicable to the first hardware element, in response to determining that the similarity index is within a specified range, and additionally output a first result of the static verification.

Machine learning (ML)-based static verification for derived hardware-design elements

State table complexity reduction in a hierarchical verification flow is provided by identifying peripheral supplies and non-peripheral supplies in a hierarchical group in a hierarchical logical block model of a circuit based on whether logic blocks associated with the power supplies provide outputs to or receive inputs from circuity external to the hierarchical group; merging associated power state tables for the peripheral supplies and the non-peripheral supplies in the hierarchical group to create a merged power state table for the hierarchical group; removing, by a processing device, any power states associated with the non-peripheral supplies from the merged power state table to create a reduced power state table; and modeling a reduced logical block based on the reduced power state table.

State table complexity reduction in a hierarchical verification flow

A method and EDA software tool for analyzing and verifying that a multi-level power managed system description (IC design) is free of power-state combination conflicts by way of identifying and reconciling voltage level and power-state combination conflicts caused by reused blocks (IP cores). The reconciliation process involves generating Power-State Tables (PSTs) associated with each hierarchical circuit level (e.g., top/system level and lower/block levels) of the IC design using both initial power supply voltage values and reconciled/revised voltage values, which are determined by the main driver voltage levels of each power supply. Initial supply relationships generated using the initial PSTs are then compared with final supply relationships generated using the reconciled PSTs, whereby conflicts are identified when one or more initial supply relationship fails to match a final supply relationship, or when one or more final supply relationship fails to match an initial supply relationship.

Voltage reconciliation in multi-level power managed systems

Scan blocks with scan chains are used to partition and test semiconductor devices using scan groups. The partitioning of the semiconductor device enables testing of all elements within each scan block, at speed, to provide fault coverage. A challenge in scan testing is keeping the power dissipation during testing under the allowed power capabilities of the tester power supplies, as the power used during scan test is much higher than that used during functional testing. A method for estimating the power dissipation of scan blocks in a circuit during the design stage is disclosed. Using the results generated, the circuit designer divides the design into an optimum number of scan blocks for test. Thus at-speed scan of the individual or groups of scan blocks can be estimated, during design, for optimizing test time while keeping the test power within acceptable limits.

Method and system thereof for optimization of power consumption of scan chains of an integrated circuit for test

A method for computing the power savings in an integrated circuit (IC) design is disclosed. The method computes the difference in power savings between techniques used for clock gating. Based on the computation results, the method outputs a script to control the implementation tool so as to provide for the best implementation clock gating technique in terms of power and area savings.

Method for computing power savings and determining the preferred clock gating circuit of an integrated circuit design

To minimize the voltage drops in an electronic circuit, existing instances are moved and decoupling capacitors are automatically inserted according to an algorithm. A model of the voltage drop on a row of gate elements is presented. The model allows for rapid computations of the effect of a particular move or insertion on voltage drop in the circuit.

Automatic voltage drop optimization

A method for &ldquo;match-delay&rdquo; buffer insertion is provided to add delays at a node without changing the input capacitance of the node as seen by the upstream node. In one embodiment, a method for inserting a delay in a node in an electrical design associated with a logic gate includes: adding the delay at the node by adding a new logic gate before the node where the new logic gate is the same cell type as the logic gate and is positioned near the logic gate. The method may further include: determining if the delay can be added by adding a new logic gate before the node, and if a new logic gate cannot be added before the node, adding the delay by adding a new logic gate after the logic gate where a combination of the logic gate and the new logic gate giving the delay to be added.

Method for match delay buffer insertion

A clock tree insertion method for distributing a clock signal in an integrated circuit design includes providing a physical design representative of the integrated circuit design, specifying a location for a root node of the clock tree in the physical design, constructing an array of buffers as the clock tree where the array of buffers is constructed to minimize the maximum insertion delay from the root node to the clock signal endpoints and to meet a predefined maximum insertion delay constraint, identifying locations in the clock tree where clock skew violations occur and correcting the clock skew violations by introducing delay at buffer locations in the clock tree having the fastest clock signal arrival times, and identifying locations in the clock tree where minimum insertion delay violations occur and correcting the minimum insertion delay violations by slowing down the arrival times of clock signal endpoints of the clock tree.

Method for balanced-delay clock tree insertion

A method and apparatus is described which enables a user to analyze an electrical design utilizing a computer. The elements of the electrical design are described at a register transfer level. Embodiments of the invention are described which allow the user to enter the elements described at the register transfer level and estimate the power consumption of portions or all of the electrical design.

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Fremont, CA, United States of America

David L Allen