Advanced Inquiry Systems, Inc.

Other

Translarity, Inc.

Compound Photonics Limited

David Keith

Morgan T Johnson

Aaron Durbin

Terry J Scheffer

Steven Howard Linn

Howard V Goetz

Jiuzhi Xue

James A Van Vechten

Lin Li

Jonathan A Sachs

Alexander Parfenov

Stephen E Brice

A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer test system includes an interposer having a first surface and a second surface facing away from the first surface. The system also includes a wafer translator having a first side facing the second surface of the interposer and a second side facing away from the first side and toward a wafer, the first side carrying a plurality of first terminals at a first scale and the second side carrying a plurality of second terminals at a second scale. The first scale is greater than the second scale.

Wafer testing system and associated methods of use and manufacture

A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a wafer translator and the wafer translator to an interposer by means of separately operable vacuums, or pressure differentials. The assembly includes a wafer translator support ring coupled to the wafer translator, wherein a first flexible material extends from the wafer translator support ring so as to enclose the space between the wafer translator and the interposer so that the space may be evacuated by a first vacuum through one or more first evacuation paths. The assembly can further include a wafer support ring coupled to the wafer and the chuck, wherein a second flexible material extends from wafer support ring so as to enclose the space between the wafer and the wafer translator so that the space may be evacuated by a second vacuum through one or more second evacuation pathways.

A wafer testing system and associated methods of use an manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a wafer translator and the wafer translator to an interposer by means of separately operable vacuums, or pressure differentials. The assembly includes a wafer translator support ring coupled to the wafer translator, wherein a first flexible material extends from the wafer translator support ring so as to enclose the space between the wafer translator and the interposer so that the space may be evacuated by a first vacuum through one or more first evacuation paths. The assembly can further include a wafer support ring coupled to the wafer and the chuck, wherein a second flexible material extends from wafer support ring so as to enclose the space between the wafer and the wafer translator so that the space may be evacuated by a second vacuum through one or more second evacuation pathways.

Wafer testing systems and associated methods of use and manufacture

An optically addressed, photoconductive spatial light modulator (SLM) operates in a transmissive mode and is capable of modulating a wide spectrum of visible light. There is no pixel structure or native pixel resolution in the SLM. The SLM has no photodiodes and does not rectify. A light projection system () in which one or more SLMs () are placed includes a write (image definition) UV light path () and a read (illumination) visible light path () to form a color image projection display. The write UV light propagates from an image display pattern source () and either sequentially or continuously writes image patterns on the photoconductive SLMs. The read visible light propagates through the SLM and is modulated by an electro-optical material, the optical properties of which change in response to the image structure carried by the write light. The result is a high efficiency display system that delivers high resolution color images through a projection lens () onto a display screen.

Transmissive, optically addressed, photosensitive spatial light modulators and color display systems incorporating same

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Vancouver, WA, United States of America

David Keith