Teradyne, Inc.

David Kaushansky

Michael Francis McGoldrick

Michael Thomas Fluet

Stephen J Bourassa

Tushar K Gohel

Lloyd K Frick

Pavel Gilenberg

Frank L Booth, Jr

David Vandervalk

Thomas D Jacobs

Pedro M Teixeira

Casey A Hersey

An example test system includes a circuit to sample a signal that is repetitive in cycles to obtain data; a processor configured to generate an eye diagram based on the data, where the eye diagram represents parametric information about the signal; and a functional test circuit to receive the signal and to perform one or more functional tests on the signal. The test systems is configured to receive the signal from a unit under test and to allow the signal to pass to the functional test circuit inline without changing at least part of the signal.

Functional testing with inline parametric testing

An example system includes circuitry to receive an input signal, to provide a related signal based on informational content of the input signal, and to obtain parametric data associated with the input signal. The parametric data represents one or more signal characteristics other than the informational content. The example system also includes a first switch that is configurable to provide first data based on the related signal to one or more first channels of the system; and a second switch that is configurable to provide second data based on the parametric data to one or more second channels of the system.

Switch matrix system

In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.

Programmable test instrument

In general, a test instrument includes a processing system programmed to control operation of the test instrument, including communication with a control system, and programmed to run one or more test programs to test a device interfaced to the test instrument, the processing system including multiple processing devices, and a configurable interface, through which communications are exchanged with the device interfaced to the test instrument, the configurable interface including physical ports, to which different configurations are assignable.

Test instrument having a configurable interface

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Winchester, MA, United States of America

David Kaushansky