Unisys Corporation

Burroughs, Inc.

David Jon Mortensen

James Rhodes

James Mason Brafford

Terry Sinclair Connacher

Randy Neaman Siade

John Charles Montgomery

Jayesh V Sheth

Glenn T Hotchkin

An electromechanical system for testing IC-chips includes a total of N chip holding subassemblies, where N is an integer greater than one and where each chip holding subassembly has sockets for holding a group of IC-modules that include the IC-chips; a moving mechanism for automatically moving the i-th chip holding subassembly from a load position in the system to a test position in the system, and visa-versa, where i ranges from 1 to N and changes with time in a sequence; and a temperature control mechanism which contacts the IC-modules at the test position. Between the moving of the i-th chip holding subassembly and the next chip holding subassembly in the sequence, the IC-chips are burn-in tested on all N of the chip holding subassemblies. Also, while the i-th chip holding subassembly is being moved, burn-in testing of IC-chips on the remaining N-1 chip holding subassemblies continues.

System for testing one or more groups of IC-chips while concurrently loading/unloading another group

An electromechanical system for testing IC-chips includes a chip holding subassembly which has sockets for holding a group of IC-modules that include the IC-chips; a moving mechanism for automatically moving the chip holding subassembly from a load position in the system to a test position in the system, and visa-versa; a temperature control mechanism which contacts the IC-modules on the chip holding subassembly only when that subassembly is at the test position; and a chip handler mechanism for automatically moving the IC-modules into and out of the sockets, when the chip holding subassembly is at the load position. At the test position, the temperature control mechanism contacts the IC-modules to control their temperature. At the load position, the chip handler mechanism automatically unloads one group of IC-modules from the sockets on the chip holding subassembly and automatically loads another group of the IC-modules into the sockets.

System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically

An electromechanical system for testing IC-chips includes a total of N chip holding subassemblies; a moving mechanism for automatically moving the i-th chip holding subassembly from a load position in the system to the test position in the systems, and visa-versa, where i ranges from 1 to N and changes with time in a sequence; and a signal generator which sends test signals to the IC-chips at the test position. Between the moving of the i-th chip holding subassembly and the next subassembly in the sequence, test signals are sent to the IC-chips on all N of the chip holding subassemblies such that the signals are shifted in time from one subassembly to another. Also, while the i-th chip holding subassembly is being moved, the time shifted test signals continue to be sent to the IC-chips on the remaining N&#x2212;1 chip holding subassemblies.

System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groups

A peripheral-controller (called a Data Link Processor) optimizes the rate of data transfers between a host computer and magnetic tape peripherals by use of a block counter sensing system for monitoring the occupation-status of word-blocks in a buffer memory. The peripheral-controller provides Automatic Read/Write Logic for buffer-peripheral tape transfers and a burst mode routine for rapid host-buffer transfers of data words. The sensing system provides means to inform a microcode sequencer when certain action routines should be executed in order to maintain steady error-free data transfer operations which minimize the need for retries of data transfer cycles previously initiated.

System for regulating data transfer operations

A data transfer system whereby a peripheral-controller manages data transfers between the host computer and a magnetic tape peripheral unit. Data undergoing transit, is temporarily stored in a buffer memory of the peripheral-controller and is monitored by a block counter monitoring system which informs a program-sequencer in the common control circuit unit of the peripheral-controller when data may be shifted into or out of the buffer memory in order to avoid or reduce the probability of access error conditions.

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Mission Viejo, CA, United States of America

David Jon Mortensen