Infineon Technologies Ag

Intel Corporation

David Johnsson

Harald Gossner

Joost Adriaan Willemen

Krzysztof Domanski

Michael Mayerhofer

Wolfgang Soldner

Jenia Elkind

Benjamin J Orr

A circuit for electrostatic discharge (ESD) protection for wide frequency range multi-band interfaces. The interface may be split into a plurality of signal paths. Each signal path may include an ESD protection circuit configured to shunt an ESD current on each signal path to either ground or supply voltage and a filter configured to block signals from other signal paths. The signal paths are connected to a common signal line such that the signals for the plurality of signal paths can be transported simultaneously. The plurality of signal paths may be a high frequency path and a low frequency path. The low frequency path may include an inductor connected in series and the high frequency path may include a capacitor or transformer connected in series. The ESD protection circuit on each signal path is placed behind the inductor, the capacitor or the transformer.

Circuit for electrostatic discharge protection for wide frequency range multi-band interfaces

An integrated circuit including ESD device is disclosed. One embodiment includes a semiconductor region being electrically isolated from adjacent semiconductor regions by an isolating region. Both an ESD device and a device configured to emit radiation are formed within the semiconductor region.

Integrated circuit including ESD device and radiation emitting device

A directional pulse injection system and method are described for injecting a pulse into a microelectronic system for electrostatic test. One example has a transformer coupled to a pulse source through a transmission line and to a conductive trace of a test board to apply the electrical pulse to the trace as a test pulse. The test board is connected to a microelectronic device under test. This example also has a cancellation pulse transmission line coupled to the pulse source and a cancellation pulse contact coupled to the pulse source through the cancellation pulse transmission line and to the trace on a side of the trace opposite the transformer to receive a cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse.

Directional pulse injection into a microelectronic system for electrostatic test

Integrated circuit including ESD device

A method and a system for ESD protection are provided. In one embodiment, the system comprises a circuit comprising at least one non-linear element, an application module configured to apply a set of current pulses to the circuit, a determination module configured to determine at least one frequency-dependent and amplitude-dependent transfer function of the circuit based on the set of applied current pulses, a modeling module configured to model at least one frequency-dependent and current-dependent impedance of the at least one non-linear element, and a simulation module to simulate a transmission to the circuit based on the model.

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Munich, Germany

David Johnsson