Honeywell Asca Inc.

Honeywell International Inc.

David Jez

Frank Martin Haran

Graham I Duck

Ross MacHattie

Payam Mousavi

Steven Dodge

Stuart James Heath

Ron Beselt

Stephane Savard

Dan Gordon

An apparatus for incorporation into time-domain spectroscopy systems that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected employs a beam splitter to generate sample and reference pulses. A detector is positioned for receiving the reference radiation pulses that do not interact with the sample. The same detector is also positioned for receiving the sample radiation pulses that emerge from the sample. The apparatus can be readily implemented by being configured between the emitter and detector of a terahertz time-domain spectrometer. The reference pulse is used to trace the changes in time and amplitude of the sample pulse. Since any changes in the reference pulse will most likely manifest in the sample pulse, the reference pulse is monitored and used to correct the sample pulse and thereby reduce the effects of jitter.

Continuous referencing for increasing measurement precision in time-domain spectroscopy

A terahertz time-domain spectrometer scanning sensor system includes a transmitter and a receiver that are secured to a mobile scanner head. Optical pump light, in the form of short pulses launched from a stationary laser located remotely from the scanner head, is delivered to the transmitter and receiver through a controlled fiber optic cable arrangement so that variations in temporal pulse relays that are associated fiber optic transmission are minimized. In this fashion, the movement of the fiber optic cable is maneuvered along a defined path so as to control the bends in the cable and thus minimize variations in temporal delays that can otherwise arise as the pulses of light are transmitted through the fiber. Pulses of laser light launched from the laser into the optical fiber will exit the cable with consistent (i) time of arrival, (ii) phase duration, and (iii) polarization state and energy.

Controlling the bends in a fiber optic cable to eliminate measurement error in a scanning terahertz sensor

An in-situ time domain spectroscopy (TDS)-based method () for non-contact characterization of properties of a sheet material while being produced by a manufacturing system (). A time domain spectrometry system () and calibration data for the system is provided. The calibration data includes data for transmitted power through or reflected power from the sheet material as a function of a moisture content of the sheet material. At least one pulse of THz or near THz radiation from a transmitter () is directed at a location on a sheet material sample () while being processed by the manufacturing system (). Transmitted or reflected radiation associated with at least one transmitted or reflected pulse from the sample location is synchronously detected by a detector () to obtain the sample data. The sample data, which is coincident data, is processed together with the calibration data () to determine at least one, and generally a plurality of properties of the sheet material sample () selected from caliper, basis weight and moisture content.

Time domain spectroscopy (TDS)-based method and system for obtaining coincident sheet material parameters

An apparatus for determining fiber orientation parameters of a sheet of material during a production process includes a polarized radiation generating system operable for providing polarized radiation having a frequency of at least 1&#xd7;10Hz. The radiation is aligned to be incident on a sheet material to be characterized. A polarimeter is aligned to receive the radiation transmitted by the sheet material. A photodetector is provided for measuring radiation received after polarization processing by the polarimeter. A processor is coupled to the photodetector for calculating Stokes parameters of the sheet material based upon intensities of the radiation received and determines at least one parameter relating to fiber orientation of the sheet material based upon the Stokes parameters.

Apparatus for characterizing fibrous materials using stokes parameters

An apparatus () for determining fiber orientation parameters of a sheet of material during a production process includes a polarized radiation generating system () operable for providing polarized radiation having a frequency of at least 1&#xd7;10Hz. The radiation is aligned to be incident on a sheet of material to be characterized (). A polarimeter () is aligned to receive the radiation transmitted by the sheet of material (). A photodetector () is provided for measuring radiation received after polarization processing by the polarimeter. A processor () is coupled to the photodetector () for calculating Stokes parameters of the moving sheet () based upon intensities of the radiation received and determines at least one parameter relating to fiber orientation of the moving sheet based upon the Stokes parameters.

Method for characterizing fibrous materials using stokes parameters

A system and method of monitoring with temperature stabilization. The system can include a housing operably connected to a fiber optic cable that provides a light wave thereto, a relay optic for receiving the light wave and being positioned in the housing, a radiation device for processing or producing radiation in the frequency range of 10 GHz to 100 THz from the light wave and being positioned in the housing, a temperature sensor in thermal communication with the housing, and a thermal management device in thermal communication with the housing where the thermal management device adjusts a temperature within the housing based on temperature conditions measured by the temperature sensor. Other embodiments are disclosed.

System and method of monitoring with temperature stabilization

A material measurement system () includes a THz generator including at least one laser source () for emitting optical pulses, the optical pulses coupled to a THz emitter () operable for emitting pulsed THz radiation at a sample location on material while being processed () by a manufacturing system. A receiver () is operable to receive the optical pulses and to detect reflected or transmitted THz radiation from the sample location () synchronously with the optical pulses and provide electrical detection signals. Synchronizing optics () is operable to receive the optical pulses from said laser and provide the optical pulses to both the receiver () and the THz emitter (). A controller () includes at least one processor () for receiving the electrical detection signals and providing a processed electrical detection signal, and an analyzer () operable to determine at least one, and generally a plurality of properties of the material from the processed electrical detection signal.

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Vancouver, Canada

David Jez