Growing community of inventors

Pasadena, CA, United States of America

David Jeon

Average Co-Inventor Count = 3.35

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 173

David JeonMorteza Gharib (7 patents)David JeonFrancisco Pereira (5 patents)David JeonAlexei Harvard (3 patents)David JeonScott S Hsieh (2 patents)David JeonJian Lu (2 patents)David JeonDarius Modarress (2 patents)David JeonMory Gharib (2 patents)David JeonDana Dabiri (2 patents)David JeonCong Wang (1 patent)David JeonMorgane Grivel (1 patent)David JeonAlessio Tamborini (1 patent)David JeonDavid Jeon (9 patents)Morteza GharibMorteza Gharib (142 patents)Francisco PereiraFrancisco Pereira (21 patents)Alexei HarvardAlexei Harvard (10 patents)Scott S HsiehScott S Hsieh (14 patents)Jian LuJian Lu (14 patents)Darius ModarressDarius Modarress (5 patents)Mory GharibMory Gharib (3 patents)Dana DabiriDana Dabiri (3 patents)Cong WangCong Wang (2 patents)Morgane GrivelMorgane Grivel (1 patent)Alessio TamboriniAlessio Tamborini (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. California Institute of Technology (9 from 4,556 patents)


9 patents:

1. 11839427 - Systems, methods, and apparatuses for ocular measurements

2. 10787231 - Systems, methods, and apparatuses for reducing hydrodynamic frictional drag

3. 10291894 - Single-sensor system for extracting depth information from image blur

4. 9596452 - Defocusing feature matching system to measure camera pose with interchangeable lens cameras

5. 9530213 - Single-sensor system for extracting depth information from image blur

6. 9524021 - Imaging surround system for touch-free display control

7. 8773507 - Defocusing feature matching system to measure camera pose with interchangeable lens cameras

8. 7612869 - Aperture coded camera for three dimensional imaging

9. 7006132 - Aperture coded camera for three dimensional imaging

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1/17/2026
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