Fei Comapny

Insitu, Inc.

Araceli Biosciences, Inc.

David James Tasker

Jason Harrison Arjavac

Henri Joseph Lezec

Pei Zou

Gerhard Daniel

Maximus Theodorus Otten

David A Head

Gary Lee Viviani

Jeffrey H Knapp

Marshall Anderson

Tyler Wilson

Marguerite Vantangoli Policelli

Methods and systems are provided for synchronizing image capture at a multi-detector imaging system. In one example, a method includes coordinating cycling of each microscope assembly of the multi-detector imaging system through a selection of illumination channels, each microscope assembly configured to obtain an image of a portion of one of more than one microplate wells simultaneously, to generate complete images of the more than one microplate wells concurrently.

Light synchronization for an imaging system

The presently disclosed technology is directed generally to unmanned vehicle systems and methods configured to satisfy a first set of export control regulations, such as those within the jurisdiction of one government entity or international body (e.g., the U.S. Department of Commerce) without falling within the purview of a second set of export control regulations, such as export control regulations within the jurisdiction of another government entity or international body (e.g., the U.S. Department of State). Through limited range of operation, limited payload types, limited capabilities, and tamper-proof or tamper-resistant features, embodiments of the unmanned vehicle system are designed to fall within the purview and under control of one agency and not within the purview and under control of another agency.

Controlled range and payload for unmanned vehicles, and associated systems and methods

An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (&#x3c;100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Method for S/TEM sample analysis

A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.

Graphical automated machine control and metrology

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Portland, OR, United States of America

David James Tasker