Raymax Technology, Inc.

Quesant Instrument Corporation

Other

Rave LLC

Ouesant Instrument Corporation

David James Ray

Robert S Harp

Jeffrey E LeClaire

Roy Wallace White

Barry F Hopkins

Michael E Haarlander

Nicholas Doe

Terence Rogers Lundy

A central floating device with a plurality of peripheral connection points and tethers. The tethers may be retractable, and are of sufficient length to allow the users some amount of spacing distance from each other. Each individual user thus maintains a separation from each other so as not to interfere with each other in the pool, lake, or body of water while remaining tethered together. The floating device may further include cup-holders, lights, storage compartments, and an anchor.

Tethered floating device

A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.

Integrated scanning probe microscope and confocal microscope

A method and apparatus includes positioning a reactant on a surface in specific location and then directing an energy source from a device at the reactant such that it modifies the surface to either remove material or add material.

Apparatus and method for modifying an object

A scanning force microscope system that employs a laser () and a probe assembly () mounted in a removable probe illuminator assembly (), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever () after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly () supports a scanning probe microscope (). Scanning probe microscope () holds a removable probe sensor assembly (). Removable probe sensor assembly () may be transported and conveniently attached to the adjustment station () where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly () may then be attached to the scanning probe microscope ().

Removable probe sensor assembly and scanning probe microscope

A scanning force microscope system that employs a laser ( ) and a probe assembly ( ) mounted in a removable probe illuminator assembly ( ), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever ( ) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly ( ) supports a scanning probe microscope ( ). Scanning probe microscope ( ) holds a removable probe sensor assembly ( ). Removable probe sensor assembly ( ) may be transported and conveniently attached to the adjustment station ( ) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly ( ) may then be attached to the scanning probe microscope ( ).

Method for replacing a probe sensor assembly on a scanning probe microscope

Scanning probe microscope system including removable probe sensor assembly

A scanning probe microscope is provided with a piezo-ceramic tube to carry the sensitive probe at its free end to translationally move the probe in the X and Y directions. Large stationary surfaces can then be scanned by probe tip motion. The tube is also capable of movement in the Z direction so that the tip can follow the contours of the surface. Optical detection means track the motion of the probe tip and generate signals corresponding to and representative of surface contours. In one mode of operation, the signals are used in a feed back loop to keep constant the spacing between the tip and the surface, in which case the error or control signals represent the contours.

Detection system for atomic force microscopes

A scanning force microscope (,) sometimes referred to as an atomic force microscope employs a laser (,) and a cantilever (,) which move proportionally to a moving reference frame (,). A fixed reference frame (,) contains optical components. A scanning mechanism creates relative movement between the fixed and moving reference frames. An optical assembly (,) is included which comprises at least one optical device in the fixed reference frame. The optical assembly permits initial alignment of the laser beam onto the cantilever and also permit the laser beam to follow the moving cantilever.

Scanning force microscope and method for beam detection and alignment

A scanning force microscope system that employs a laser (76) and a probe assembly (24) mounted in a removable probe illuminator assembly (22), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever (30) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly (240) supports a scanning probe microscope (244). Scanning probe microscope (244) holds a removable probe sensor assembly (242). Removable probe sensor assembly (242) may be transported and conveniently attached to the adjustment station (250) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly (242) may then be attached to the scanning probe microscope (244).

Scanning probe microscope system including removable probe sensor

A scanning force microscope employs a laser (76) which creates a laser beam (26). The laser and a probe assembly (24) are mounted in a removable probe illuminator assembly (22). The removable probe illumination assembly is mounted to the moving portion of a scanning mechanism. The scanning mechanism creates relative movement between the probe illuminator assembly and a sample (28). The removal of the probe illuminator assembly permits alignment of said laser beam onto a cantilever (30) after removal of said illuminator assembly from the microscope. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly.

Scanning force microscope with removable probe illuminator assembly

A scanning force microscope (10) sometimes referred to as an atomic force microscope employs a laser (32) and a cantilever (28) which move proportionally to a moving reference frame (64). A fixed reference frame (11) contains optical components. A scanning mechanism creates relative movement between the fixed and moving reference frames. An optical assembly (114) is included which comprises at least one optical device in the fixed reference frame. The optical assembly permits initial alignment of the laser beam onto the cantilever and also permit the laser beam to follow the moving cantilever.

Scanning force microscope

A method for initially positioning the scanning probe of a scanning probe microscope includes the steps of initially using fine position control to reduce the distance between probe and sample and, if the sample surface is not encountered, reversing the direction of the fine position control to an intermediate position and then using a coarse control in predetermined increments to narrow the distance between the probe and the sample. The fine control is again used and if the sample surface is not encountered, the steps are repeated until the surface is encountered so that the scanning operation can commence.

Method of engaging the scanning probe of a scanning probe microscope

Detecting system for scanning microscopes

Scanned-probe microscope systems (20, 140) are disclosed with analog control loops (24, 144) that can be electronically programmed to select from a plurality of transfer functions. The amplitude of the control loop reference signal (64) can also be electronically programmed. A controller (26) enables an operator to quickly program these operational characteristics. The controller preferably includes a visual display (33) and a recording device (32) to facilitate the programming and to display and store the scanning data obtained with the selected characteristics.

Growing community of inventors

Agoura Hills, CA, United States of America

David James Ray