Agilent Technologies, Inc.

Other

David James Mielke

Gayvin E Stong

Dennis B Batchelor

Victoria Meier

Jeffrey Thomas Robertson

An apparatus permits built-in self-test ('BIST') of an IC that includes a memory element having more than one impermissible operation. A code generator accepts a clock signal and generates a test code in response to it. A decoder accepts the test code and generates at least two output lines to disable the impermissible operations during the test. When the decoder is in a decode disabled condition, the output lines reflect a value that permit all possible memory operations.

Apparatus and method for random pattern built in self-test

A system and method for automating a static-timing analysis of an integrated circuit design are provided. A representative system includes a network coupled to a plurality of data storage devices, the data storage devices containing a knowledge base that defines an integrated circuit design; a computer coupled to the network, the computer including logic for receiving information defining an integrated circuit representation from the plurality of data storage devices; and a memory element associated with the computer, the memory element configured to store logic, the logic configured to generate static-timing scripts that reflect a plurality of timing models. A representative method includes the following steps: acquiring circuit information, the circuit information comprising a plurality of functional blocks; identifying a timing model to apply to each of the plurality of functional blocks; defining the hierarchical relationships between each of the plurality of functional blocks; extracting the circuit information responsive to the identifying and defining steps to complete a simulation of each of the plurality of functional blocks; and forwarding the simulation to a static-timing engine.

System and method for applying timing models in a static-timing analysis of a hierarchical integrated circuit design

Systems and methods for timing a linear data path element within an integrated circuit design are provided. A representative system includes a computer and a memory element associated with the computer. The computer includes logic for receiving information describing the integrated circuit design. The integrated circuit design includes a description of a signal-timing path and the clock distribution system across the integrated circuit. The memory is configured with executable steps to generate a model of a signal that traverses a signal-timing path that is coupled to a linear element. The model includes a mechanism for simulating clock signal operation over a plurality of clock distribution structure types. A representative method includes the following steps: acquiring circuit information; identifying a signal path within the circuit information; recognizing when the signal-timing path is coupled to a linear element; associating a clock uncertainty with the clock signal; determining a confidence interval for the signal-timing path responsive to the recognizing step, wherein the clock signal is propagated along the signal-timing path; and associating the confidence interval with the signal-timing path.

Systems and methods for timing a linear data path element during signal-timing verification of an integrated circuit design

Systems and methods for time-budgeting an integrated circuit design are provided. A representative system includes an information acquisition device, a computer, and a memory element associated with the computer, the memory element configured to store the information and associate a timing point that accounts for signal delays between the border of a functional block and the various circuits within the block. A representative method includes the following steps: acquiring circuit information that describes the conductors that traverse a border of the functional block, inserting a timing point in the information, determining a delay time in response to the timing point, and deriving a constraint in response to the delay time.

Systems and methods for time-budgeting a complex hierarchical integrated circuit

A gating signal checker system and method are provided to perform clock gating check on a logic cell. In accordance with one aspect of the invention, the system includes logic that determines a clock transition time of a clock input into the logic cell, and logic that determines a transition time of at least one gating signal input into the logic cell. Also included in the gating signal checker system is logic that calculates a clock difference time between the clock transition time and the transition time of the at least one gating signal input into the logic cell, and logic that determines that the logic cell fails the clock gating check if the clock difference time is negative. In accordance with another aspect of the invention, a method performs a clock gating check on a logic cell by determining a clock transition time of a clock input into the logic cell, and determining a transition time of at least one gating signal input into the logic cell. Then, the method calculates a clock difference time between the clock transition time and the transition time of the at least one gating signal input into the logic cell, and determines that the logic cell passes the clock gating check if the clock difference time is positive.

Systems and methods for performing clock gating checks

A controller is provided that is configured to receive a timing value for a static timing model and a timing value for an extracted timing model. The controller is further configured to determine whether the timing value for the extracted timing model falls within a permissible range of deviation from the timing value for the static timing model.

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Fort Collins, CO, United States of America

David James Mielke