Hewlett-packard Company

Agilent Technologies, Inc.

Other

Keysight Technologies, Inc.

David J Dascher

Thomas F Uhling

Keith C Griggs

Lewis R Dove

Michael Thomas McTigue

Allen Montijo

James Edward Cannon

Eric R Ehlers

Kenneth Rush

John Ralph Lindsey

Stuart O Hall

Distributed amplifier systems and methods are disclosed. An example distributed amplifier system includes first stage traveling wave amplifier (TWA) circuitry that is controllable to provide one of a first set of discrete gain settings. The first stage TWA circuitry includes a first input transmission line, a first output transmission line, and a first plurality of amplifiers coupled antiparallel between the first input transmission line and the first output transmission line. The first set of discrete gain settings has approximately constant logarithmic spacing.

Variable gain distributed amplifier systems and methods

Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.

Characterization and correction of voltage probe, current probe and cable

A dual pivot game controller including two rotating assemblies, one for each of a user's two hands, is described. Each of the two rotating assemblies is coupled to a base by a pivoting coupling, and each pivoting coupling includes an axis of rotation about which its respective rotating assembly rotates. Accordingly, each rotating assembly and pivoting coupling share an axes of rotation, and each rotating assembly is thus configured to rotate relative to the base to which it is coupled. The axes of rotation usually reside in a common plane and are substantially non-parallel, such that they intersect at an axes intersection angle. An axes intersection angle of about 52&#xb0; is typical. The two rotating assemblies are usually operationally coupled to each other such that they rotate in tandem during use.

Dual pivot game controller

An apparatus and method for determining if ringing in an output signal from a receiver that processes an input signal is the result of a bandwidth limitation in the receiver that processes an input signal rather than ringing in the input signal is disclosed. The apparatus includes the receiver and a ring suppression filter. The ring suppression filter receives the receiver output signal and generates a ring suppressed output signal therefrom. The receiver and the ring suppression filter provide a first aggregate system response such that the ring suppressed output signal does not include ringing introduced by the receiver. The first aggregate system response is linear in phase.

Filter for identifying signal artifacts in bandwidth-limited instruments

An integrated step attenuator ('ISA') monolithically integrated on a single chip for adjusting an input signal. The ISA may include a step attenuation network ('SAN') that may include at least one switchable attenuation section, and at least one electronically switchable trimming network (&#x201c;ESTN&#x201d;). The SAN may be configured to adjust the input signal responsive to the state of a switch that bridges the attenuation sections of the SAN, and the ESTN may be configured to adjust the input signal responsive to the state of a switch in signal communication with one or more shunt resistors in the ESTN.

Broadband step attenuator with improved time domain performance

A micro-browser has pair of rods each rod entering a corresponding bore in a sleeve that retains them, and that may itself be carried by a grip shaped to be rotated between a thumb and a finger. The edge of a small circuit board is soldered at the distal end of the rod. One of the rods is allowed to rotate within its bore in the sleeve, while the other is held stationary by a notch in the sleeve. The rotatable rod has a captive spring that resists the force of probe contact. Each board carries a coupling network connected to a short sharp probe tip bent downward away from the plane of its board, allowing the distance between the probe tips to be a function of the amount of rotation. The other end of each coupling network is coupled to a short length of a respective 50 &#x3a9; coaxial cable that passes through an axial slot in the grip to enter an amplifier pod that drives a main cable leading to test equipment. The rods may be held within the bores by friction created by slight bends in the rods. The circuit boards each include shields connected together at a location that is as close as possible to the probe tips by arranging that the rods touch each other near the probe tips. If the rods are parallel, then there is a slight bend in the non-rotating rod at the location where it passes the non-probe-carrying edge of the circuit board, such that it touches the corresponding portion of the rotatable rod. If the rods are both straight, then the axes of the rods are coplanar but convergent.

Compliant micro-browser for a hand held probe

A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.

Voltage probe systems having improved bandwidth capability

Resonance within an attenuator relay caused by stray coupling capacitances to, and stray reactance within the switched conductor that replaces the attenuator section, is mitigated by reducing the stray coupling capacitances to as low a value as possible, and by using a conductor that is a section of controlled impedance transmission line that matches the system into which the attenuator relay has been placed. A substrate having SPDT LIMMS switches on either side of a switched transmission line segment and its associated attenuator, all of which are fabricated on the substrate, will have significantly lower stray coupling capacitance across the open parts of the switches when the attenuator segment is in use. This will increase the frequency for the onset of the resonance driven by the RF voltage drop across the attenuator. A reduction in the amplitude of the resonance can be obtained by including on the substrate an additional pair of LIMMS damping switches at each end of the transmission line segment. These damping switches each connect a terminating resistor to the ends of the transmission line segment when the attenuator section is in use. This loads the resonator and reduces the amplitude of the resonance. Still further improvement can be obtained by locating one of the damping switches and its termination resistor near (but preferably not exactly at) the middle of the transmission line segment.

High frequency attenuator using liquid metal micro switches

A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.

Method of making multiple lead voltage probe

Multiple lead voltage probe and method of making same

An analog electronic test probe includes hundreds of inputs each connected to two amplifiers, each in a separate multiplexer stage on an integrated circuit. A programmer, responsive to a dial, shifts data through a shift register of latches each of which is connected to one of the amplifiers, activating the amplifier(s) connected to the selected input, thereby multiplexing it (them) to selected output(s). Similarly, the gain for each output may be selected. An outdisable circuit connected to the outputs of each multiplexer and the outputs of each IC chip causes each output to appear electrically as an open circuit when no input associated with the multiplexer or chip is selected. This permits any number of multiplexers and IC chips to be daisy-chained together.

Multiplexing electronic test probe

A probe head includes integrated circuit chip inputs, a ground plane on a circuit board, and hundreds of probe leads comprising traces on the circuit board connected between the inputs and a circuit under test. Each trace is about 3 mils wide. There is a DICLAD polytetrafluoroethylene dielectric material of dielectric constant of about 2.2 between the ground and traces. Every other trace is electrically connected to the ground plane. Input resistors are buried in the circuit board and there is an on-chip input divider network. The customer defines the grounded pins of a circuit to be tested. Probe leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials.

Multiple lead analog voltage probe with high signal integrity over a

An analog test probe includes an integrated circuit having a large number of separate channels, each connected to one of its inputs. There is a plurality of probe tips and 100 ohm coaxial cables, each cable connecting one of said probe tips and one of the IC inputs. This structure introduces reverse signals into the channels that would seriously degrade probe operation if not removed. A capacitor and resistor in each probe tip, and in series with the coaxial cable and ground, match the impedance of the coaxial cable in the reverse direction, so that reverse signals are dissipated in the resistance and capacitance and do not reflect into the probe channels.

Growing community of inventors

Monument, CO, United States of America

David J Dascher