Northrop Grumman Systems Corporation

David I Cross

Jonathan D Egan

Robert J March

Ty L Barkdoll

Embodiments of the present disclosure relate generally to testing one or more signal paths. For example, a signal path may include a phase shifter that may impart a phase shift to signals passing through the signal path. Some embodiments may test a phase shift imparted to a signal by the signal path, including the phase shifter. Some embodiments may test the phase shift by comparing the phase of a signal at an input of the signal path with the phase of a signal at the output of the signal path. Some embodiments may test the phase shift by providing a signal at inputs of two phase paths and comparing the phases of signals at the outputs of the signal paths. Some embodiments may further adjust a phase shifter responsive to the test. Related devices, systems and methods are also disclosed.

Growing community of inventors

Jessup, MD, United States of America

David I Cross