The Mathworks, Inc.

David Hruska

Andrew T Campbell

David M Saxe

David A Foti

Gregory V Aloe

Gerhard P Stoeckel

Ajay B Puvvala

A device receives test methods that include input arguments that match parameters. The test methods are used to test one or more portions of dynamically-type programming code, and the parameters define conditions for the test methods. The device receives one or more values for each of the parameters, and applies the parameters and the one or more values to different ones of the test methods. The device executes the different ones of the test methods, with the applied parameters and the applied one or more values, to generate results, and outputs or stores the results.

Combination and reuse of parameters in an automated test environment

A device receives a first result that includes first data, and a second result that includes second data, and determines whether a comparator supports the first data and the second data. When the comparator supports the first data and the second data, the device utilizes the comparator to select comparison logic for the first data of the first result and for the second data of the second result, compares the first result and the second result, using the selected comparison logic, to determine whether the first result is equivalent to the second result, and outputs or stores the determination of whether the first result is equivalent to the second result.

Mechanism for comparison of disparate data in data structures

A device receives a first test class associated with a first fixture. The first test class includes first method(s) to test portion(s) of dynamically-type programming code, and the first fixture defines first environment(s) for the first method(s). The device receives a second test class associated with the first fixture and a second fixture. The second test class includes second method(s) to test the code portion(s). The first fixture defines the first environment(s) for the second method(s), and the second fixture defines second environment(s) for the second method(s). The device combines the first method(s) of the first test class and the second method(s) of the second test class to create a test group, and analyzes the test group to determine whether the test group is correctly organized based on the first fixture and the second fixture. The device provides a reorganized test group when the test group is incorrectly organized.

Growing community of inventors

Chestnut Hill, MA, United States of America

David Hruska