Growing community of inventors

Munich, Germany

David Herbison

Average Co-Inventor Count = 2.72

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 10

David HerbisonHolger Wenske (3 patents)David HerbisonStephan Henzler (2 patents)David HerbisonArmin Hanneberg (2 patents)David HerbisonThomas Eichler (2 patents)David HerbisonMarc Hesener (2 patents)David HerbisonChristoph Schwarzer (2 patents)David HerbisonTobias Werth (2 patents)David HerbisonYifan Wang (1 patent)David HerbisonMario Träber (1 patent)David HerbisonStefan Guenther (1 patent)David HerbisonThomas Piorek (1 patent)David HerbisonMark Hesener (1 patent)David HerbisonEmil Neborovski (1 patent)David HerbisonDavid Herbison (6 patents)Holger WenskeHolger Wenske (12 patents)Stephan HenzlerStephan Henzler (70 patents)Armin HannebergArmin Hanneberg (7 patents)Thomas EichlerThomas Eichler (5 patents)Marc HesenerMarc Hesener (5 patents)Christoph SchwarzerChristoph Schwarzer (2 patents)Tobias WerthTobias Werth (2 patents)Yifan WangYifan Wang (3 patents)Mario TräberMario Träber (3 patents)Stefan GuentherStefan Guenther (1 patent)Thomas PiorekThomas Piorek (1 patent)Mark HesenerMark Hesener (1 patent)Emil NeborovskiEmil Neborovski (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Intel Corporation (3 from 54,750 patents)

2. Lantiq Deutschland Gmbh (2 from 228 patents)

3. Intel Deutschland Gmbh (1 from 254 patents)


6 patents:

1. 10938304 - Voltage- and current-based control of direct current (DC)-DC converter

2. 10622898 - Voltage regulator control systems and methods

3. 9529765 - Integrated circuit (IC) with reconfigurable digital voltage regulator fabric

4. 9389628 - Digitally controlled buck-boost regulator having a custom mapping controller

5. 7830285 - Circuit with calibration circuit portion

6. 7816907 - Integrated circuit with a measuring circuit and method of configuring an integrated circuit with a measuring circuit

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as of
12/29/2025
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