The Perkin-elmer Corporation

Applied Biosystems, LLC

Applera Corporation

Perkinelmer Las, Inc.

Perkinelmer Instruments LLC

Ge Healthcare Bio-sciences Ab

Perkinelmer Singapore Pte Limited

Perkin-elmer Corp., Applied Biosystems Division

Pcr Max Limited

Orbital Sciences Corporation

Helicos Biosciences Corporation

Berthold Gmbh & Co. Kg

University of Connecticut

Perkinelmer Health Sciences, Inc.

Svg Lithography Systems, Inc.

David H Tracy

Yongdong Wang

Paul G Saviano

Jerry E Cahill

Alan M Ganz

Kevin S Bodner

Bernhard H Radziuk

Mark F Oldham

Donald R Sandell

Timothy M Woudenberg

Steven J Boege

Aldrich N K Lau

Koichi Nishikida

J Michael Phillips

Dar Bahatt

Klaus Fischer

David A Huppler

Enrico G Picozza

Robert Alan Hoult

John S Shigeura

Robert P Ragusa

Adrian Fawcett

Charles R Connell

Will Bloch

Lawrence A Haff

Michael I Crockett

Eugene F Young

Juan C Ivaldi

Joseph DiCesare

Linda G Lee

David G Welkie

Donald Leonard Smith

Anatole M Lokshin

Michael J O'Brien

Kevin Daley Simmons

Robert A Hoult

David E Burchfield

Adam J Patkin

Richard W Noreiks

Lincoln J McBride

Walter Bohler

Gitesh Kumar

John P Coates

Stephen A Myers

Christopher B Hanna

Chandra Roychoudhuri

Richard Spragg

William J Hubbard

Peter L Lundberg

Brian G Balistee

Aaron Weber

The invention relates to optical systems and methods for measurement of samples in multiple sample vessels using an array of light sources where the light from the light sources is divided into multiple light beams, and each beam is directed to a sample vessel.

Optical system for multiple reactions

Optical systems, and corresponding methods, for multiple reactions are provided. The optical systems are in a fixed position relative to a thermal assembly and include at least one array of excitation sources (e.g., light emitting diodes (LEDs)) configured to output excitation energy along an excitation optical path. In addition, a detector configured to receive emission energy along a detection optical path in the same plane as the excitation optical path is also provided.

The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Luminescence reference standards

An apparatus for quantitation of surface-binding optical resonance profiles includes a calibration module including a calibration scan result fetcher, a calibration profile creation module, and a fitting module. The fitting module includes an experimental scan result fetcher, a calibration profile fetcher, and a resonance shift determination module. A method for qualifying a surface plasmon resonance chip is also described herein.

Method and apparatus for quantitating surface-binding optical resonance profiles

A light source for an atomizing device, specifically an atom absorption spectrometer comprising one, two, or more lamps, whose ray can be selected by means of at least one two-dimensionally moveable optical selection element, and which can be directed in the direction of atomizing device. Fine-tuning is thereby achieved quickly with little constructive expenditure and with low costs. A very high degree of accuracy is possible from the selector through a rotational and highly adjustable rotation spindle.

Light source

Empirical profile curve fits () are used to quantitative the surface optical resonance profiles () using two EPF stages of calibration and fit. The calibration surface binding optical resonance scan is obtained with fine angle or wavelength spacing over a range including the full resonance profiles for all regions. The main calibration module () together with the first derivative curves and the diagnostic information generates each profile region of interest. The individual ROI scans are used for measurements of the resonance shifts relative to the empirical profile. In a preferred embodiment the instrument control and data acquisition software sets the internal parameters in the EPT calibration module and sends the raw data from a calibration scan to the EPF Calibration module which funnels the data through a sub sampler and a Savitsky-Golan smoothing routine before taking derivatives and characterizing the data to create the empirical profile for the chip ().

In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.

Method of instrument standardization for a spectroscopic device

Systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

A method of increasing the spatial uniformity of the detected intensity of a beam of light from a laser in a system including the laser and a light detector. In one embodiment the method includes the steps of generating a beam of light with the laser; and moving the beam of light and the light detector relative to each other, such that the detector averages the spatial intensity of the beam of light over time. In another embodiment the invention relates to a system for increasing the detected spatial uniformity of the intensity of a beam of light. In one embodiment the system comprises a light detector; a laser source for generating the beam of light; and a means for moving the beam of light and the detector relative to one another such that the detector averages the intensity of the light beam over time.

Systems and methods for reducing detected intensity non-uniformity in a laser beam

An optical resonance analysis system comprising a sensor means () and an illumination means () for generating non-monochromatic illumination. The illumination means () further comprises a means for generating illumination at a plurality of angles, a lens system for projecting said illumination at said plurality of angles () and a dispersive device () for dispersing said illumination at each of said plurality of angles so that there is a correlation between said plurality of angles and the wavelengths of said illumination such that a resonance condition is generated on said sensor mean () for all wavelengths generated by said non-monochromatic source simultaneously. The analysis system also comprises a detection means () for detecting the reflected or transmitted illumination. Another embodiment comprises an anamorphic imaging means ().

Optical resonance analysis system

Growing community of inventors

Norwalk, CT, United States of America

David H Tracy