Sandia Corporation

David G Moore

Dennis P Roach

Kirk A Rackow

Joseph DiMambro

Ciji L Nelson

Cameron J Dasch

Kyle Thompson

Richard W Poland

Enrico C Quintana

Jack D Heister

George K Hodges

James E Prindville

John P Ellegood

An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.

Multi-step contrast sensitivity gauge

An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections

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Albuquerque, NM, United States of America

David G Moore