Intel Corporation

Other

David G Ellis

Gary W Brady

Theodore Zale Schoenborn

Bruce Querbach

Christopher P Mozak

David Zimmerman

Jay Joseph Nejedlo

Gene A Frederiksen

William K Lui

Christopher W Hampson

Ifar Wan

Yulan Zhang

Tonia G Morris

Zvika Greenfield

James M Shehadi

Eric S Gayles

Peter B Bloch

Amjad M Khan

Christina Jue

Zhenglong Wu

Eshwar Gollapudi

Adee Ofir Ran

Andrew W Martwick

Amir Mezer

Bill A Munson

Bryan L Spry

Tomer Levy

Balaji Parthasarathy

Sean R Babcock

Richard J Glass

Michael J Tripp

Philip Abraham

Louis J Johnson

Christopher E Yunker

Andrew S Liu

Stephen J Peters

William O Brooks

Jayasekhar Tholiyil

Rony Ghattas

Sanjay R Ravi

Jeffrey M Shuey

Mike Wiznerowicz

Steven R Fordyce

Andy Groves

Daniel Becerra Perez

Ramakrishna Mallela

Ophir Gazinski

Daniel Becerra

Charles D Lucas

David J Zimmerman

A reference voltage value and a chip select (CS) signal timing delay provided to memory devices can be determined based on samples of the CS signal received by the memory devices. The CS signal can be provided to the memory devices with varying time delays and for various reference voltages. Various samples of the CS signal from the memory devices can indicate different times for rising and falling edges of the CS signal. A composite signal eye can be generated by the latest occurring rising edge and the earliest occurring falling edge of the CS signal. The reference voltage value and timing delay can be chosen based on the composite signal eye width that is the closest to a reference eye width.

Training for chip select signal read operations by memory devices

A host controller apparatus for determining information related to a time shift for transmitting instructions on a command and address bus includes an interface for transmitting a plurality of instruction signals to a memory module via the command and address bus and for receiving a loopback feedback signal from the memory module. The host controller apparatus further includes a control module configured to transmit the plurality of instruction signals to the memory module via the command and address bus. The control module is configured to receive the loopback feedback signal from the memory module. The loopback feedback signal includes a looped-back composite version of the plurality of instruction signals. The control module is configured to determine the information related to the time shift for transmitting instructions on the command and address bus based on the loopback feedback signal.

Host controller apparatus, host controller device, and method for a host controller for determining information related to a time shift for transmitting instructions on a command and address bus, host controller and computer system

In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory. In one embodiment, data patterns are generated as a function of memory addresses and periodic address offsets.

Integrated circuit defect detection and repair

In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory.

A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.

Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation

A memory subsystem includes logic buffer coupled to a command bus between a memory controller and a memory device. The logic buffer detects that the memory controller places the command bus in a state where the memory controller does not drive the command bus with a valid executable memory device command. In response to detecting the state of the command bus, the logic buffer generates a signal pattern and injects the signal pattern on the command bus after a scheduler of the memory controller to drive the command bus with the signal pattern.

Memory subsystem command bus stress testing

A memory subsystem includes a test signal generator of a memory controller that generates a test data signal in response to the memory controller receiving a test transaction. The test transaction indicates one or more I/O operations to perform on an associated memory device. The test signal generator can generate data signals from various different pattern generators. The memory controller scheduler schedules the test data signal pattern, and sends it to the memory device. The memory device can then execute I/O operation(s) to implement the test transaction. The memory controller can read back data written to a specific address of the memory device and compare the read back data with expected data. When the read back data and the expected data do not match, the memory controller can record an error. The error can include the specific address of the error, the specific data, and/or encoded data.

Memory subsystem data bus stress testing

REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.

Robust memory link testing using memory controller

According to one embodiment, a built-in self test (IBIST) architecture/methodology is disclosed. The IBIST provides for testing the functionality of an interconnect (such as a bus) between a transmitter and a receiver component. The IBIST architecture includes a pattern generator and a pattern checker. The pattern checker operates to compare a received plurality of bits (for the pattern generator) with a previously stored plurality of bits.

High performance serial bus testing methodology

A multi-bit test value is loaded into a built-in latch of the IC component, and a pad of the component is selected for testing. A number of different sequences of test values are automatically generated, based on the stored test value, without scanning-in additional multi-bit values into the latch. A signal that is based on the different sequences of test values is driven into the selected pad and looped back. A difference between the test values and the looped back version of the test values is determined, while automatically adjusting driver and/or receiver characteristics to determine a margin of operation of on-chip I/O buffering for the selected pad.

Automatic self test of an integrated circuit component via AC I/O loopback

A built-in self test (BIST) unit, of a primary integrated circuit (IC) component of a computer system, is programmed or hardwired with a test pattern. The test pattern is launched in multiple test cycles, to test an interconnect bus of the computer system or perform a device validation test of the component. A pin assignment of the pattern is automatically changed after each test cycle, without requiring re-programming of the BIST unit to do so.

Push button mode automatic pattern switching for interconnect built-in self test

Video data is received from multiple video receptors. This multidimensional video data is converted from the video receptors into a multidimensional audio representation of the multidimensional video data and are the multidimensional audio representation is output using multiple audio output devices. The conversion of the multidimensional video data includes generating a three-dimensional representation of the multidimensional video data, and generating an audio landscape representation with three-dimensional features based on the three-dimensional representation.

Three dimensional audio vision

The present invention is directed to a method and apparatus for managing data flow between a serial bus device which operates at a first data rate and a parallel port device which operates at a second data rate. A serial bus receiver receives data from the serial bus device at the first data rate. A buffer unit is coupled to the serial bus receiver and the parallel port device. The buffer unit stores the received data at the first data rate and transfers the stored data to the parallel port device at the second data rate.

Managing data flow between a serial bus device and a parallel port

The present invention is directed to a method and apparatus for converting between serial bus cycles and parallel port commands. A serial bus processor processes a serial bus transaction which is represented by the serial bus cycles and is responsive to the parallel port commands. A state machine circuit is coupled to the serial bus processor to provide a plurality of states corresponding to the serial bus transaction. The state machine circuit transitions from one of the states to any one of the states in response to a change condition asserted by a state signal.

Conversion between serial bus cycles and parallel port commands using a state machine

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Tualatin, OR, United States of America

David G Ellis