International Business Machines Corporation

David Edward Schmitt

Gregory John Uhlmann

Yuen H Chan

Anthony Gus Aipperspach

Tobias Werner

Silke Penth

John D Davis

Paul Alan Bunce

Brian James Yavoich

Phil Christopher Felice Paone

Brian Joy Reed

Phil Christopher Paone

David Howard Allen

Toshiaki Kirihata

John Matthew Safran

A system for dual mode operation having power saving and active modes in a stacked circuit topology having logic preservation is provided. The system includes a pre-charge circuit and a sleep mode control circuit for providing a signal to disable a plurality of circuit elements and switching a mode of the system, the sleep mode control circuit being coupled to the pre-charge circuit and further being coupled to a logic function circuit, wherein the plurality of circuit elements comprise logic gates and transistor devices. The system also includes a keeper circuit coupled to the global bitline, and the logic function circuit coupled to a solar bitline, wherein the logic function circuit preserves a state of the solar bitline, the state of the global bitline determines the state of the solar bitline. The system includes an effective pull-up transistor coupled to the sleep mode control circuit and the logic function circuit.

Dual mode operation having power saving and active modes in a stacked circuit topology with logic preservation

A memory array can include a global evaluation circuit, a local evaluation circuit for evaluating a voltage level of a local bit line and a wake transistor configured to connect an output of the local evaluation circuit to a global bit line (GBL) of the global evaluation circuit. The global evaluation circuit can include a holding circuit. The wake transistor can be turned on in response to a read signal, and remain on while the GBL is precharged to a logical 'high' voltage. Memory cells connected to the at least one local bit line can be addressed, and the local bit line can be pulled to a logical 'low' voltage for a first time period. The GBL can be pulled to a logical low voltage for a second time period, and the holding circuit polarity can be reversed during a third time period.

Managing semiconductor memory array leakage current

It is provided a memory circuit comprising n inputs; n+1 columns, wherein each column is connected to a plurality of memory cells; wherein the i-th (1&#x2266;i&#x2266;n&#x2212;1) column is configured to be conductive connectable to the i-th input or to the (i+1)-th input or neither to the i-th input nor to the (i+1)-th input; a first FET and a second FET in series configured for connecting the i-th column to a defined voltage level; wherein a first gate signal renders the first FET conductive, if the i-th column is not in conductive connection with the i-th input; wherein a second gate signal renders the second FET conductive, if the i-th column is not in conductive connection with the (i+1)-th input.

Memory circuit

A method and circuit for implementing precise eFuse resistance measurement, and a design structure on which the subject circuit resides are provided. An eFuse sense amplifier coupled to an eFuse array and used for current measurements includes balanced odd and even bitlines, and a plurality of programmable reference resistors connected to the balanced odd and even bitlines. First a baseline current measurement is made through one of the programmable reference resistors, and used to identify a network baseline resistance. A current measurement is made for an eFuse path including a selected eFuse and used to identify the resistance of the selected eFuse.

Implementing precise resistance measurement for 2D array efuse bit cell using differential sense amplifier, balanced bitlines, and programmable reference resistor

A method and circuit for implementing an eFuse sense amplifier, and a design structure on which the subject circuit resides are provided. A sensing circuit includes a pair of cross-coupled inverters, each formed by a pair of series connected P-channel field effect transistors (PFETs) and an N-channel field effect transistor (NFET). A first pull-up resistor is coupled between a positive voltage supply rail and a first sensing node of the sensing circuit. A second pull-up resistor is coupled between a positive voltage supply rail and a second sensing node of the sensing circuit. A first bitline is coupled to the first sensing node of the sensing circuit and a second bitline coupled to the second sensing node of the sensing circuit. One of a respective reference resistor and a respective eFuse cell is selectively coupled to the first bitline and the second bitline.

Method and circuit for implementing enhanced eFuse sense circuit

A method and circuit for implementing Efuse sense amplifier verification, and a design structure on which the subject circuit resides are provided. A first predefined resistor value is sensed relative to a reference resistor. A second predefined resistor value is sensed relative to a reference resistor. Responsive to identifying a respective sense amplifier output resulting from the sensing steps of an unblown eFuse and a blown eFuse, valid operation of the sense amplifier is identified.

Method and circuit for implementing eFuse sense amplifier verification

A design structure for electrically programmable fuse sense circuit having an electrically programmable fuse and a reference resistance. A first current source is coupled, through a first switch, to the electrically programmable fuse. A second current source is coupled, through a second switch, to the reference resistance. A precharge signal enables the first current source, the second current source and closes the first switch and the second switch, creating voltage drops across the electrically programmable fuse and the reference resistance. When the precharge signal goes inactive, the first current source and the second current source are shut off, and, at the same time the first switch and the second switch are opened. A latching circuit uses a difference in the voltage drops when the precharge signal goes inactive to store a state of the electrically programmable fuse, indicative of whether the electrically programmable fuse is blown or unblown.

Electrically programmable fuse sense circuit

A electrically programmable fuse sense circuit having an electrically programmable fuse and a reference resistance. A first current source is coupled, through a first switch, to the electrically programmable fuse. A second current source is coupled, through a second switch, to the reference resistance. A precharge signal enables the first current source, the second current source and closes the first switch and the second switch, creating voltage drops across the electrically programmable fuse and the reference resistance. When the precharge signal goes inactive, the first current source and the second current source are shut off, and, at the same time the first switch and the second switch are opened. A latching circuit uses a difference in the voltage drops when the precharge signal goes inactive to store a state of the electrically programmable fuse, indicative of whether the electrically programmable fuse is blown or unblown.

Growing community of inventors

Rochester, MN, United States of America

David Edward Schmitt