Agilent Technologies, Inc.

Hewlett-packard Company

Keysight Technologies, Inc.

David E Root

Jason M Horn

Jianjun Xu

Daniel B Gunyan

John Wood

Jan Verspecht

Loren C Betts

Jeffrey W Meyer

David D Sharrit

Nicholas B Tuffilaro

Masaya Iwamoto

Siqi Fan

A method of modeling a nonlinear component includes providing a physical model for modeling a characteristic of the nonlinear component defined by a physical expression having a physical nonlinear function depending on variables and parameters of the nonlinear component; determining performance data for the characteristic; extracting global parameter values for the parameters based on the performance data; extracting local parameter values for the selected parameter, while keeping fixed the extracted global parameter values for the remaining parameters, based on the performance data corresponding to the characteristic using the physical expression; training an ANN function from the extracted local parameter values for the selected parameter depending on a variable; and determining a hybrid model for modeling the characteristic of the nonlinear component defined by a modified physical expression including the physical nonlinear function, the remaining parameters, and the trained ANN function depending on the variable in place of the selected parameter.

System and method for modeling nonlinear component for use in circuit design

A method and system are provided for generating a nonlinear simulation model of a device under test (DUT). The method and system include receiving large-signal nonlinear waveform data based on responses of the DUT to input signals, determining a set of first dynamical variables and a set of second dynamical variables from the nonlinear waveform data, calculating values of second dynamical variables, providing nonlinear constitutive relations as functions of the first dynamical variables and the calculated values of the second dynamical variables, and compiling the nonlinear simulation model of the DUT using the identified nonlinear constitutive relations.

Method and system for generating nonlinear simulation model

A model of a device is generated. An input port of the device is stimulated with a large amplitude signal having a central frequency. A first port of the device is perturbed with a small amplitude signal tone. The small amplitude signal tone is at a frequency offset slightly from a harmonic of the central frequency. Spectral component frequencies of a resulting signal from the device are obtained to determine model coefficients for the device. At least some of the spectral component frequencies occur at frequencies offset slightly from harmonics of the central frequency.

Behavioral model generation

A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

Method and apparatus for determining a response of a DUT to a desired large signal, and for determining input tones required to produce a desired output

The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define 'large-signal S-parameters') with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Large signal scattering functions from orthogonal phase measurements

The present invention includes a method for generating a model of a circuit having an input port and an output port. The method determines an amplitude for current leaving the output port at a frequency &#x3c9;when a signal that includes a carrier at &#x3c9;modulated by a signal V(t) is input to the input port, wherein &#x3c9;is a harmonic of &#x3c9;. The determined amplitude is used to determine values for a set of constants, a, such that a function f(V,a) provides an estimate of the current, I(t), leaving the output port at a frequency &#x3c9;when a signal having the form is input to the input port. Here V(t) is a component of a set of values V. The f(V,a) are used to provide a simulator component adapted for use in a circuit simulator.

Method for generating a circuit model

A modeling system for active semiconductor devices, such as gallium arsenide field effect transistors, for nonlinear (e.g., harmonic balance) circuit simulation. The model enables fast and unambiguous construction (model generation) by explicit calculations applied to raw device response data obtained using an adaptive, automated data acquisition system employed to characterize the device. The automated data acquisition system obtains the data adaptively, taking more data where nonlinearities are most severe and within a calculated, safe operating range of the device. The system converts conventional d.c. and S-parameter data directly into a detailed, device-specific, large-signal model. The system is extremely fast and replaces the need for conventional parameter extraction based on circuit simulation and optimization techniques. The measurement-based model improves large-signal simulation accuracy over an extended operating frequency range, because the model nonlinearities are explicitly constructed from device response data. The model is non quasi-static in that it accounts for frequency dispersion effects. Scaling rules allow devices of various geometries to be simulated from measurements on a single device. Therefore, the model is general, being technology and process independent in that the same calculation procedure applies to any device for which the equivalent circuit is valid. The model implementation in the automated data acquisition system, model generator, and harmonic balance (nonlinear) circuit simulator provides an efficient, practical system for state-of-the-art nonlinear circuit design.

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Santa Rosa, CA, United States of America

David E Root